Emerging Lithographic Technologies VI 2002
DOI: 10.1117/12.472293
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High-resolution templates for step and flash imprint lithography

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Cited by 44 publications
(10 citation statements)
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“…The smallest features transferred into a silicon mold are ∼10-nm wide lines written using electron-beam lithography . The smallest features produced in a quartz mold are 20 nm. …”
Section: 1 Hard Pattern Transfer Elementsmentioning
confidence: 99%
“…The smallest features transferred into a silicon mold are ∼10-nm wide lines written using electron-beam lithography . The smallest features produced in a quartz mold are 20 nm. …”
Section: 1 Hard Pattern Transfer Elementsmentioning
confidence: 99%
“…SFIL is more suitable than NIL for fabricating structures consisting of multiple stacked layers, because, due to the transparency of the mold, layer alignment is easier with SFIL. Furthermore, because of the milder molding conditions of SFIL, the shaped layers do not need to undergo large temperature changes for each subsequent layer, as is the case with NIL . Photocurable low‐viscous acrylate‐based precursors and biomaterials can be used as resists.…”
Section: Fabrication Methods For 3d Structures With Areas Of Various mentioning
confidence: 99%
“…After contacting this mold with a low -viscosity, photocurable polymer, the polymer is held under UV light. With this method, features as small as 30 nm can be produced [54] . The strengths of this approach are the rapid cyclic time ( < 5 min/replication) and the ability of optical mold alignment with features on the underlying surface [53,55] .…”
Section: Soft Lithographymentioning
confidence: 99%