High Resolution and Differential PIXE combined with RBS, EBS and AFM analysis of magnesium titanate (MgTiO3) multilayer structures

Reis, M.A.; Alves, L.C.; Barradas, N.P.; Chaves, P.C.; Nunes, B.; Taborda, A.; Surendran, Kuzhichalil Peethambharan; Wu, Aiying; Vilarinho, Paula M.; Alves, E.

doi:10.1016/j.nimb.2010.02.113

Cited by 20 publications

(14 citation statements)

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“…In this case, using the same beam energy to analyse both the standards and the unknown samples3 leads to a very simple quantitative analytical procedure. On the other hand, in the other extreme of quantitatively analysable complexity one can find, presently, the analysis of multilayer medium thick films having light, medium and heavy elements in their composition 4–6…”

Section: Introductionmentioning

confidence: 99%

PIXE analysis of multilayer targets

et al. 2011

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Particle induced X-ray emission (PIXE) analysis is generally accepted to be a depth insensitive technique and most of the work up until recently has been oriented to the analysis of in-depth homogeneous samples. Up until recently, multilayer targets were normally looked upon as a source of problems, implying a limitation to qualitative or semi-quantitative approaches. The growing need to analyse layered targets having complex structures or close Z elements, which provide unsolvable Rutherford backscattering spectrometry (RBS) spectra, pointed out the need to change this situation. The coupling of two software codes, namely NDF and DATTPIXE, was thus carried out a few years ago based on the development of a PIXE yields simulation library, LibCPIXE. Since then, developments were introduced at various levels, from the software code level to the level of analytical methodologies and even equipment. Starting in the concepts of equivalent depth and differential PIXE, and ending in the possibilities opened up by the use of microcalorimeter high-resolution detectors within this context, an overview of the current status of development of the analytical technology involved is made.

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Section: Introductionmentioning

confidence: 99%

PIXE analysis of multilayer targets

et al. 2011

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“…We should point out that self-consistent PIXE/BS has been available for a long time [11] [12], and accurate analysis using "Total IBA" has been applied recently to applications in geochemistry (PIXE/BS/ERD, [13]), Alzheimer's disease (mapping STIM/PIXE/BS, [14]), biomedical surfaces (PIXE/BS, [15]), amino-functionalised gate oxides (RBS/ERD, [16]), and multilayer materials (RBS/EBS/PIXE/HR-PIXE, [17]): in the latter case high energy resolution PIXE was also essential.…”

Section: Why "Total Iba"?mentioning

confidence: 99%

“…Recently, high resolution microcalorimeter detectors have been introduced which allow energy dispersive spectra to be collected at high resolution over a wide energy range, which has a dramatic effect on the applicability of this sort of data: we have already cited the use of such data in a Total IBA study (see [17]). The only trouble is that high resolution spectrometry reveals a very large number of lines that are usually ignored, that have complicated chemical state and beam energy (excitation mode) dependencies, and are not yet well understood to the extent that they may conceal new physics [107].…”

Section: Chemical Analysis With Ibamentioning

confidence: 99%

“Total IBA” – Where are we?

Jeynes

Bailey

Bright

et al. 2012

Nuclear Instruments and Methods in Physics Research Section B:

117

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“…This valence information is regularly used in EPMA, the electron spectroscopies (XPS, AES), and the absorption spectroscopies (EELS, XAS). It can also be used in PIXE if a high resolution detector is used, which could be WDX [133] [134], or one of the new high resolution calorimetric EDS detectors [135]. Of course, high resolution also allows disentangling of overlapping peaks which often occurs, especially for the L lines, and is one main cause of the degradation of sensitivity [136].…”

Section: Particle-induced X-ray Emissionmentioning

confidence: 99%

“…Therefore, although even in the quite recent past it was understandable that self-consistent PIXE/BS was often judged to be too problematical to be worth the effort, this is not the case today. We should point out that self-consistent PIXE/BS has been available for a long time (OMDAQ [255] and "IBAlab" [256]), and accurate analysis using "Total IBA" has been applied recently to applications in geochemistry (PIXE/BS/ERD, [257]), biomedical surfaces (PIXE/BS, [258]), Alzheimer's disease (mapping STIM/PIXE/BS, [259]), amino-functionalised gate oxides (RBS/ERD, [260]), fish otolith composition (microbeam BS/ERD/PIXE, [261]), cultural heritage studies in the Louvre Museum (BS/PIXE, [262]), and multilayer materials (RBS/EBS/PIXE/HR-PIXE, [263]): in the latter case high energy resolution PIXE was also essential.…”

Section: "Total Iba"mentioning

confidence: 99%

Ion Beam Analysis: A Century of Exploiting the Electronic and Nuclear Structure of the Atom for Materials Characterisation

Jeynes

Webb

Lohstroh

2011

Rev. Accl. Sci. Tech.

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Analysis using MeV ion beams is a thin film characterisation technique invented some 50 years ago which has recently had the benefit of a number of important advances. This review will cover damage profiling in crystals including studies of defects in semiconductors, surface studies, and depth profiling with sputtering. But it will concentrate on thin film depth profiling using Rutherford backscattering, particle induced X-ray emission and related techniques in the deliberately synergistic way that has only recently become possible. In this review of these new developments, we will show how this integrated approach, which we might call “total IBA”, has given the technique great analytical power

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High Resolution and Differential PIXE combined with RBS, EBS and AFM analysis of magnesium titanate (MgTiO3) multilayer structures

Cited by 20 publications

References 10 publications

PIXE analysis of multilayer targets

PIXE analysis of multilayer targets

“Total IBA” – Where are we?

Ion Beam Analysis: A Century of Exploiting the Electronic and Nuclear Structure of the Atom for Materials Characterisation

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