1995
DOI: 10.1016/0168-9002(95)00150-6
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High precision electron optical system for absolute and CD-measurements on large substrates

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Cited by 18 publications
(7 citation statements)
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“…After drying in air, the sample was annealed at 500 1C in Ar/H 2 flow (1300 sccm, 15 vol% hydrogen) for 1 h. Then the temperature was immediately increased up to the cutting set-point (900 1C) and held for 1 h. SEM imaging. SEM images have been recorded with a Zeiss Ultra Plus SEM using 10 keV primary electrons and the in-lens detector that is expected to be sensitive to SE1 and SE2 secondary electrons 39 . For triangulation, images have been recorded with 30 keV electrons in the high-current mode using the SE2 detector.…”
Section: Methodsmentioning
confidence: 99%
“…After drying in air, the sample was annealed at 500 1C in Ar/H 2 flow (1300 sccm, 15 vol% hydrogen) for 1 h. Then the temperature was immediately increased up to the cutting set-point (900 1C) and held for 1 h. SEM imaging. SEM images have been recorded with a Zeiss Ultra Plus SEM using 10 keV primary electrons and the in-lens detector that is expected to be sensitive to SE1 and SE2 secondary electrons 39 . For triangulation, images have been recorded with 30 keV electrons in the high-current mode using the SE2 detector.…”
Section: Methodsmentioning
confidence: 99%
“…1b shows SEM images of an individual mSWNT on SiO 2 /Si before (left) and after (right) EBIO-induced gap formation. The images were recorded with an inlens detector that is expected to be sensitive to SE1 and SE2 secondary electrons 14 . For better visibility of the mSWNT, we used voltage-contrast scanning electron microscopy (VCSEM) to suppress the SEs of the SiO 2 /Si substrate 15 .…”
Section: Resultsmentioning
confidence: 99%
“…The electrostatic lens consists of two electrodes. 1 Due to its large deflection in the second stage of the beam separator, the PE beam cannot be described by paraxial electron optics. At the lower electrode, a so-called cap voltage up to 3 kV can be applied in order to increase the extraction field on the specimen.…”
Section: Concept and Designmentioning
confidence: 99%