2018 IEEE International Ultrasonics Symposium (IUS) 2018
DOI: 10.1109/ultsym.2018.8580045
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High Power, Wideband Single Crystal XBAW Technology for sub-6 GHz Micro RF Filter Applications

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Cited by 36 publications
(19 citation statements)
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“…Resonators showed k eff 2 of 6.32% and 7.63%, and Q max of 1523 and 1572, respectively. In 2018, a new high-power BAW device was created on a 6-inch Si substrate with high Q max of 3685 and FOM of 222 working at 1.8 GHz ( Figure 8 a) [ 43 ]. Furthermore, experiments also confirmed that single crystal AlN devices had better power handling capabilities than AlN-based devices ( Figure 8 b).…”
Section: Methodsmentioning
confidence: 99%
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“…Resonators showed k eff 2 of 6.32% and 7.63%, and Q max of 1523 and 1572, respectively. In 2018, a new high-power BAW device was created on a 6-inch Si substrate with high Q max of 3685 and FOM of 222 working at 1.8 GHz ( Figure 8 a) [ 43 ]. Furthermore, experiments also confirmed that single crystal AlN devices had better power handling capabilities than AlN-based devices ( Figure 8 b).…”
Section: Methodsmentioning
confidence: 99%
“… ( a ) Q-value and figure of merit (FOM) as functions of frequency when using XBAR TM (single crystal AlN technology) [ 43 ]. ( b ) Measured power level capability of single crystal AlN and poly-crystalline AlN [ 43 ]. Reproduced with permission from [ 43 ].…”
Section: Figurementioning
confidence: 99%
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“…However, work on MOCVD AlN has mainly focused on using AlN as a buffer layer [25,26,27]. MOCVD has also been suggested [28] and recently used for the fabrication of AlN FBARs [13].…”
Section: Aluminum Nitride Depositionmentioning
confidence: 99%
“…Effective in-plane actuation and sensing would require the deposition of AlN on the vertical sidewalls of MEMS structures, as shown in Figure 1.1c, for which physical vapor deposition (PVD) methods, such as sputtering, are not well-suited. Chemical vapor deposition (CVD) should offer better conformal coverage [12] and high crystal quality [13]. A piezoelectric sidewall MEMS actuator structure is illustrated in Figure 1.1d.…”
Section: Introductionmentioning
confidence: 99%