2004
DOI: 10.1049/ip-cds:20040455
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High power silicon RF LDMOSFET technology for 2.1 GHz power amplifier applications

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Cited by 11 publications
(2 citation statements)
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“…The C ov value basically depends on the extension of the N drift under the polysilicon gate and the gate oxide thickness (T ox ). The C j value depends on the N dr doping concentration and the P body/N drift junction depth [12].…”
Section: Analysis Of Tgldmos Dynamic Characteristicsmentioning
confidence: 99%
“…The C ov value basically depends on the extension of the N drift under the polysilicon gate and the gate oxide thickness (T ox ). The C j value depends on the N dr doping concentration and the P body/N drift junction depth [12].…”
Section: Analysis Of Tgldmos Dynamic Characteristicsmentioning
confidence: 99%
“…Bulk-silicon vertical double-diffused MOSFETs (VDMOSFETs) have excellent linearity, but suffer from limited high-frequency gain due to a large gate-drain capacitance and source lead inductance to ground. To reach higher RF power gain while maintaining good linearity, laterally diffused MOSFETs (LDMOSFETs) were developed [1], [2] and have become the state-of-the-art silicon devices for highly linear RF power applications [3], [4].…”
mentioning
confidence: 99%