High power laser diode manufacturing and reliability

Li, B.; Harnagel, G. L.; Parke, R.; Rossin, Victor; O’Brien, Stephen; Nagarajan, Radhakrishnan; Craig, Richard R.

doi:10.1109/leos.1998.739799

Cited by 2 publications

(1 citation statement)

References 3 publications

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“…With a typical activation energy of 0.5 eV for AlGaAs/InGaAs the Arrhenius relation predicts an aging acceleration by a factor of 7 referring to room temperature (20°C). [1] [3] The following tables summarize the aging conditions: The aging results after 360h at 50°C (2500h at 20°C) are shown in fig.7. The optical output power after aging is related to the power before aging and called the normalized optical power.…”

Section: Aging and Degradationmentioning

confidence: 99%

Packaging influence on laser bars of different dimensions

et al. 2009

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The reliability of high-power diode laser bars is limited by the thermo-mechanical stress occurring during the packaging process and operation. The stress is caused by the mismatch of the thermal expansion coefficients between heat sink and laser bar. In general the stress influence grows with the bar size. The development of tapered laser bars leads to higher cavity lengths so the thermo-mechanical stress in the longitudinal direction becomes more important. In this work the packaging influences on different sized laser bars are compared. At first thermal and thermo-mechanical influences are evaluated in FEM-simulations. Afterwards laser bars of different lengths and widths are mounted and characterized. The occurring strain is analyzed by electroluminescence using the correlation between stress and polarization properties of the laser bar radiation. Because of the correlation between temperature and wavelength, a thermal analysis of the mounted laser bars can be done by emitter resolved spectra scanning. The influence on reliability is analyzed in an aging study with intermediate characterization steps.

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Section: Aging and Degradationmentioning

confidence: 99%