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1986
DOI: 10.1109/jssc.1986.1052506
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High-performance designs with CMOS analog standard cells

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Cited by 27 publications
(6 citation statements)
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“…(2) Yael R sub = (R x _ acl + RX_Sli)//(Ry_aCI + R y _ Sli ) (1) where R X _ ael and R Y _ ael are resistances under the active region, R Y _ Sli and R y _ sti are the resistances under shallow trench isolation (STI) regions in the x and Y directions, which can be calculated for both directions as in equation (2) and (3).…”
Section: Passive Sub-circuit Cellsmentioning
confidence: 99%
See 1 more Smart Citation
“…(2) Yael R sub = (R x _ acl + RX_Sli)//(Ry_aCI + R y _ Sli ) (1) where R X _ ael and R Y _ ael are resistances under the active region, R Y _ Sli and R y _ sti are the resistances under shallow trench isolation (STI) regions in the x and Y directions, which can be calculated for both directions as in equation (2) and (3).…”
Section: Passive Sub-circuit Cellsmentioning
confidence: 99%
“…Standard-ceIl-based analog design was first proposed and attempted in a 3-J.lm CMOS process nearly two decades ago [1] [2]. The feasibility of such analog design methodology is hampered by the performance penalty, design flexibility and area overhead.…”
Section: Introductionmentioning
confidence: 99%
“…The cell-based analog layout methodology was first attempted in a 3-μm CMOS process nearly two decades ago [1] [2]. More recently, a RF cell-based modeling platform for parameterized sub-circuit cells layout was proposed based on a 0.13-μm CMOS process [3].…”
Section: Introductionmentioning
confidence: 99%
“…Standard-cell-based analog design was first proposed and attempted in a 3-Pm CMOS process nearly two decades ago [1] [2]. The feasibility of such analog design methodology is hampered by the performance penalty, design flexibility and area overhead.…”
Section: Introductionmentioning
confidence: 99%