2008
DOI: 10.1364/oe.16.000328
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High efficiency silicon nitride surface grating couplers

Abstract: High efficiency surface grating couplers for silicon nitride waveguides have been designed, fabricated, and characterized. Coupling efficiencies exceeding 60 % are reported at a wavelength of 1.31 mum, as well as angular and wavelength -3 dB tolerances of 4 degrees and 50 nm, respectively. When the wavelength is increased from 1310 nm to 1450 nm the coupling efficiency progressively decreases but remains above 20 % at 1450 nm. The influence of the duty ratio of the grating has also been investigated: maximum c… Show more

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Cited by 81 publications
(43 citation statements)
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“…47 Using DLW polymer photonic wirebonds for interchip communication have been demonstrated, 48 illustrating that waveguiding in DLW-written photonic components can be achieved with low loss. 50 Here we extend current photonic integrated circuits to full three dimensions by combining planar lithography with DLW. Using DLW allows us to realize circuit elements that cannot be fabricated with traditional methods as a powerful approach for next-generation on-chip optical components.…”
Section: Introductionmentioning
confidence: 99%
“…47 Using DLW polymer photonic wirebonds for interchip communication have been demonstrated, 48 illustrating that waveguiding in DLW-written photonic components can be achieved with low loss. 50 Here we extend current photonic integrated circuits to full three dimensions by combining planar lithography with DLW. Using DLW allows us to realize circuit elements that cannot be fabricated with traditional methods as a powerful approach for next-generation on-chip optical components.…”
Section: Introductionmentioning
confidence: 99%
“…3. While the lower index contrast of SiN limits grating efficiency, the insertion loss can be significantly improved with a thicker SiN layer [31], a backside mirror [32], a second deposited layer [33], or an additional (partial) etch step [34]. With a backside mirror (which could be integrated easily in this process), insertion loss of 2.6 dB has been demonstrated [32], and insertion loss of < 2 dB has been simulated [31] in a SiN single-etch process similar to this work.…”
Section: Fabrication and Passive Devicesmentioning
confidence: 99%
“…Currently, most works were focused on improving the coupling efficiency for a specific designed angle such as θ = 0 • [7] or θ = 10 • [8]. They suffer from a very tight angular tolerance with angular-full-width-halfmaximum (AFWHM) usually being 3 • [9] or 4 • [10]. In other words, the coupling efficiency decreases rapidly if θ deviates from the designed angle.…”
Section: Introductionmentioning
confidence: 99%