Optical diffraction tomography (ODT) is a recent imaging technique that combines the experimental methods of phase microscopy and synthetic aperture with the mathematical tools of inverse scattering theory. We show experimentally that this approach permits us to obtain the map of permittivity of highly scattering samples with axial and transverse resolutions that are much better than that of a microscope with the same numerical aperture.
High efficiency surface grating couplers for silicon nitride waveguides have been designed, fabricated, and characterized. Coupling efficiencies exceeding 60 % are reported at a wavelength of 1.31 mum, as well as angular and wavelength -3 dB tolerances of 4 degrees and 50 nm, respectively. When the wavelength is increased from 1310 nm to 1450 nm the coupling efficiency progressively decreases but remains above 20 % at 1450 nm. The influence of the duty ratio of the grating has also been investigated: maximum coupling efficiency was obtained at 50 % duty ratio.
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