2009 IEEE Nuclear Science Symposium Conference Record (NSS/MIC) 2009
DOI: 10.1109/nssmic.2009.5402256
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High aspect ratio deep RIE for novel 3D radiation sensors in high energy physics applications

Abstract: Abstract-3D detectors with electrodes penetrating through the entire silicon substrate have many advantages over conventional planar silicon technology, for example, high radiation tolerance. High aspect ratio through-wafer holes are essential in such fabrication, and deep reactive ion etching (DRIE) is used. A series of DRIE processes were tested and optimised to achieve the required aspect ratio, and in 5-μm wide trenches, aspect ratios of 58:1 were achieved.

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Cited by 9 publications
(6 citation statements)
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References 18 publications
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“…The process was therefore adapted to the specific tools of the SINTEF clean room. The main changes are: DRIE mask: Aluminum was substituted for thick resist, as neither resist nor silicon oxide offered sufficient selectivity for the long high aspect ratio etching [ 32 ]; When the n-type electrodes were doped and filled, they were capped with a protection oxide of 300 nm. Note that polysilicon filling was still performed at Stanford Nanofabrication Facility because of limitations in the polysilicon process at SINTEF MiNaLab.…”
Section: Overview Of Fabrication Technologies For 3d Detectorsmentioning
confidence: 99%
“…The process was therefore adapted to the specific tools of the SINTEF clean room. The main changes are: DRIE mask: Aluminum was substituted for thick resist, as neither resist nor silicon oxide offered sufficient selectivity for the long high aspect ratio etching [ 32 ]; When the n-type electrodes were doped and filled, they were capped with a protection oxide of 300 nm. Note that polysilicon filling was still performed at Stanford Nanofabrication Facility because of limitations in the polysilicon process at SINTEF MiNaLab.…”
Section: Overview Of Fabrication Technologies For 3d Detectorsmentioning
confidence: 99%
“…In the case of the multi-layer SWS as presented in this paper, etching process can be one of the solution, due to its high aspect ratio and precise structure comes from high frequency coverage beyond 400 GHz. A silicon structure which has aspect ratio more than 1:50 fabricated by deep reactive-ion etching has been reported by [23,24].…”
Section: Anti-reflection Coating Of Silicon Lensmentioning
confidence: 99%
“…An aspect ratio of 18.3 was achieved in the 285 µm thick wafers (Fig.2a) and using the same process on 5 µm trenches, an aspect ratio of about 54:1 was achieved (Fig.2b). More details of these DRIE processes can be found in ref [15]. Polymer that accumulated on the wafers during the DRIE process was then removed by oxygen plasma cleaning and the aluminium mask was removed.…”
Section: Fabrication Of Full 3d Sensors With Active Edge At Sintefmentioning
confidence: 99%
“…The effective drift lengths also reduce significantly. After being irradiated with a fluence of 10 15 n/cm 2 , the calculated effective drift lengths are reduced to 150 μm for electrons and 50 μm for holes at -20 o C [3,4]. These drift lengths are shorter than the distance between the n and the p electrodes in a planar detector, which is approximately equal to the wafer thickness and is typically between 250 and 500 μm.…”
Section: Introductionmentioning
confidence: 99%