“…They pointed to two origins of the high stress: - Different oxide thickness between front and backsides of the wafers, leading to a bow around −130 μm [ 31 ]. Silicon nitride was deposited to avoid this asymmetry, and bow was reduced to +20 μm [ 33 ]. In both cases, wafer thickness was not directly specified, but if it was measured on the wafer mentioned in those papers (process wafer of 250 μm bonded on a 350 μm support wafer) these bow values imply really a large amount of stress, insuperable on thinner wafer, or after grinding of the support wafer;
- Polysilicon filling of the electrodes also induced a large stress, but this was mitigated by careful handling and planning [ 33 ].
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