Heterodyne lock-in thermal coupling measurements in integrated circuits: Applications to test and characterization

Altet, Josep; Aldrete-Vidrio, Eduardo; Mateo, D.; Salhi, A.; Grauby, Stéphane; Claeys, W.; Dilhaire, S.; Perpiñà, X.; Jordà, X.

doi:10.1063/1.3073963

Cited by 3 publications

(1 citation statement)

References 8 publications

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“…To the best of the authors' knowledge, the use of temperature measurements to characterize analog circuits was first proposed in [16][17][18]. In this paper, we demonstrate that key small-signal (frequency response) and large-signal (linearity) parameters of RF circuits can be monitored by measuring the temperature with non-invasive temperature sensors embedded in the same silicon die.…”

Section: Introductionmentioning

confidence: 91%

Strategies for built-in characterization testing and performance monitoring of analog RF circuits with temperature measurements

Aldrete-Vidrio

Mateo

Altet

et al. 2010

Meas. Sci. Technol.

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This paper presents two approaches to characterize RF circuits with built-in differential temperature measurements, namely the homodyne and heterodyne methods. Both non-invasive methods are analyzed theoretically and discussed with regard to the respective trade-offs associated with practical off-chip methodologies as well as on-chip measurement scenarios. Strategies are defined to extract the center frequency and 1 dB compression point of a narrow-band LNA operating around 1 GHz. The proposed techniques are experimentally demonstrated using a compact and efficient on-chip temperature sensor for built-in test purposes that has a power consumption of 15 μW and a layout area of 0.005 mm 2 in a 0.25 μm CMOS technology. Validating results from off-chip interferometer-based temperature measurements and conventional electrical characterization results are compared with the on-chip measurements, showing the capability of the techniques to estimate the center frequency and 1 dB compression point of the LNA with errors of approximately 6% and 0.5 dB, respectively.

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Section: Introductionmentioning

confidence: 91%

Strategies for built-in characterization testing and performance monitoring of analog RF circuits with temperature measurements

Aldrete-Vidrio

Mateo

Altet

et al. 2010

Meas. Sci. Technol.

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Frequency-resolved temperature imaging of integrated circuits with full field heterodyne interferometry

Suck

Tessier

Warnasooriya

et al. 2010

Applied Physics Letters

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We report a fast imaging method based on full field heterodyne interferometry for the purpose of frequency resolved temperature imaging. An integrated circuit is supplied with a modulated current resulting into a temperature modulation. The frequency content for this modulation is detected using an object beam and a reference beam, frequency-shifted to create a beating of the interference pattern. We obtain frequency domain spectra of the temperature with excellent precision.

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Temperature sensors and measurements to test analogue circuits: questions and answers

Altet

Rubio

Reverter

et al. 2016

2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW)

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We have been working in the field of temperature sensors and temperature measurements to test analogue circuits during the past 10 years. As we have presented different works in many conferences, we have collected many interesting questions, some of them collected more than once!. Here you have some of them. Our goal in this paper\ud is to introduce temperature measurements and temperature sensors to test analog circuits from the highest level of abstraction. This paper has been written with the goal to provide basic understanding and present some of the possibilities of temperature sensors and measurements to test integrated circuits in general, analog in particular.Peer ReviewedPostprint (published version

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Heterodyne lock-in thermal coupling measurements in integrated circuits: Applications to test and characterization

Cited by 3 publications

References 8 publications

Strategies for built-in characterization testing and performance monitoring of analog RF circuits with temperature measurements

Strategies for built-in characterization testing and performance monitoring of analog RF circuits with temperature measurements

Frequency-resolved temperature imaging of integrated circuits with full field heterodyne interferometry

Temperature sensors and measurements to test analogue circuits: questions and answers

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