Heavy ion characterization of SEU mitigation methods for the Virtex FPGA

Sturesson, Fredrik; Mattsson, Sören; Carmichael, C.; Harboe-Sørensen, R.

doi:10.1109/radecs.2001.1159294

Cited by 6 publications

(4 citation statements)

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“…Operating in a space environment raises a number of issues that affect the design of a system, e.g., radiation can negatively impact the lifespan, performance and reliability of a digital system [1], [2]. As more advanced process nodes with smaller geometries are introduced, designing for fault tolerance is becoming an increasingly important aspect.…”

Section: Introductionmentioning

confidence: 99%

“…While it is true that SRAM-based FPGAs are sensitive to radiation-induced upsets in both their configuration and user memory [1], it is important to acknowledge that satellite FPGA applications range from instruments with relaxed timing and availability requirements, all the way up to mission-critical systems, requiring different levels of fault tolerance. The aim of this work is to investigate the feasibility of using Xilinx's SRAM-based FPGAs with triple modular redundancy (TMR) and scrubbing techniques for space applications.…”

Section: Introductionmentioning

confidence: 99%

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Assessing scrubbing techniques for Xilinx SRAM-based FPGAs in space applications

Brosser

Milh

Geijer

et al. 2014

2014 International Conference on Field-Programmable Technology (FPT)

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SRAM-based FPGAs are becoming increasingly attractive for use in space applications due to their reconfigurability and signal processing capabilities, as well as their increasing speed and capacity. Traditional SRAM-based FPGAs, however, are highly sensitive to the ionizing radiation environment in space, making them prone to radiation-induced memory upsets. In this paper, we evaluate and compare scrubbing techniques for Xilinx SRAM-based FPGAs with respect to radiation-induced single event upsets. A test framework using an exchangeable payload is developed for this purpose and run on a Xilinx Virtex-5 FPGA. We show that recent SRAM-based FPGAs can constitute a cost-efficient alternative to radiation-hardened or antifuse FPGAs for non-critical space application such as satellite instruments.

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Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Assessing scrubbing techniques for Xilinx SRAM-based FPGAs in space applications

Brosser

Milh

Geijer

et al. 2014

2014 International Conference on Field-Programmable Technology (FPT)

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“…SRAM-based FPGAs are more vulnerable to soft errors compared with ASICs, because most of logic functions and interconnects in FPGAs are implemented by SRAM cells. A soft error can have a permanent impact on SRAM-based FPGAs till the configuration scrubbing is applied [1].…”

Section: Introductionmentioning

confidence: 99%

IPF: In-Place X-Filling to Mitigate Soft Errors in SRAM-Based FPGAs

Feng

Jing

Chen

et al. 2011

2011 21st International Conference on Field Programmable Logic and Applications

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Abstract-SRAM-based Field Programmable Gate Arrays (FPGAs) are vulnerable to Single Event Upsets (SEUs). We show that a large portion (40%-60% for the circuits in our experiments) of the total used LUT configuration bits are don't care bits, and propose to decide the logic values of don't care bits such that soft errors are reduced. Our approaches are efficient and do not change LUT level placement and routing. Therefore, they are suitable for design closure. For the ten largest combinational MCNC benchmark circuits mapped for 6-LUTs, our approaches obtain 20% chip level Mean Time To Failure (MTTF) improvements, compared to the baseline mapped by Berkeley ABC mapper. They obtain 3× more chiplevel MTTF improvements and are 128× faster when compared to the existing best in-place IPD algorithm.

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“…This has the advantage of adaptability. However it is this property that makes the device susceptible to SEUs[19]. Upsets in configuration memory can be detected by comparing its contents with a known, good state and can then be corrected by refreshing the state of memory[4].…”

mentioning

confidence: 99%