2016
DOI: 10.1107/s1600577515020354
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Hartmann wavefront sensors and their application at FLASH

Abstract: Different types of Hartmann wavefront sensors are presented which are usable for a variety of applications in the soft X-ray spectral region at FLASH, the free-electron laser (FEL) in Hamburg. As a typical application, online measurements of photon beam parameters during mirror alignment are reported on. A compact Hartmann sensor, operating in the wavelength range from 4 to 38 nm, was used to determine the wavefront quality as well as aberrations of individual FEL pulses during the alignment procedure. Beam ch… Show more

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Cited by 45 publications
(22 citation statements)
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“…Gas monitor detectors are able to measure the total photon number in a single, few-femtosecond pulse 9 , but cannot account for the intensity distribution within the focal spot on the sample. This distribution is typically measured separately from the actual experiment using wave-front sensing 10 12 , ablative imprints 13 , 14 , or by detecting the transmitted intensity through a small aperture or behind a sharp knife-edge scanned across the beam in the sample plane 2 , 15 . These approaches are highly invasive and cannot be performed in tandem with the majority of FEL experiments.…”
Section: Introductionmentioning
confidence: 99%
“…Gas monitor detectors are able to measure the total photon number in a single, few-femtosecond pulse 9 , but cannot account for the intensity distribution within the focal spot on the sample. This distribution is typically measured separately from the actual experiment using wave-front sensing 10 12 , ablative imprints 13 , 14 , or by detecting the transmitted intensity through a small aperture or behind a sharp knife-edge scanned across the beam in the sample plane 2 , 15 . These approaches are highly invasive and cannot be performed in tandem with the majority of FEL experiments.…”
Section: Introductionmentioning
confidence: 99%
“…In addition to the photon energy, pulse duration, and spectral characteristics, it is important to have an accurate knowledge of the single pulse x-ray wavefront, which affects focal plane intensity and profile, spot size, and spatial resolution, as well as centroid location within the focal plane. Among techniques currently in use are the following: burn patterns that ablate material as a function of intensity across the focal plane [5,6]; Hartmann masks, which track localized wavefront vectors [7,8]; double grating interferometers, each grating having a two-dimensional checkerboard pattern, where the second grating produces a spatially downshifted Moiré pattern [9,10]; and x-ray speckle tracking techniques [11].…”
Section: Introductionmentioning
confidence: 99%
“…For direct measurement of the XUV intensity profile, the XUV camera is placed directly after the filters without spectrometer. For wavefront measurement, the XUV camera is replaced by a XUV wavefront sensor with alignment for tip/tilt and the vertical/horizontal axis [24,25] and a 300 nm-thick Al filter without supporting mesh is used. …”
Section: Introductionmentioning
confidence: 99%