Hardening of (Pb,Cd)Te Crystal Lattice with an Increasing CdTe Content in the Solid Solution

Kuna, R.; Adamiak, S.; Petit, S.; Baroni, Patrick; Gas, Katarzyna; Minikayev, R.; Szczerbakow, A.; Łażewski, J.; Szuszkiewicz, W.

doi:10.12693/aphyspola.130.1245

Cited by 8 publications

(10 citation statements)

References 16 publications

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“…Quite recently, we have examined selected mechanical properties of this particular semiconductor. What we have found out is an important (343) increase of the H value with an increasing Cd content in (Pb,Cd)Te solid solution [13]. At the same time, determined by us the Young modulus E remains at a constant value, at least within an experimental error.…”

Section: Introductionsupporting

confidence: 69%

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The Young Modulus and Microhardness Anisotropy in (Pb,Cd)Te Solid Solution Crystallizing in the Rock Salt Structure and Containing 5% of Cd

et al. 2017

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A single crystal of (Pb,Cd)Te solid solution with Cd content equal to 5% was grown by self-selecting vapour growth technique and characterized by powder X-ray diffraction using the X'Pert PANalytical diffractometer and Cu Kα 1 radiation. The X-ray diffraction pattern refinement demonstrated the fcc structure of the rock-salt type of investigated sample, no precipitates or other crystal phases were detected. The sample chemical composition was determined on the basis of measured lattice parameter value. Next, the Young modulus and microhardness were determined by the nanoindentation for carefully prepared, (001), (011) and (111)-oriented single crystal plates. The slight anisotropy of two parameters mentioned above has been found and compared with available literature data.

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Section: Introductionsupporting

confidence: 69%

“…Since 2009 several physical properties of these crystals have been both investigated and reported (see, e.g., [11][12][13][14]). Quite recently, we have examined selected mechanical properties of this particular semiconductor.…”

Section: Introductionmentioning

confidence: 99%

The Young Modulus and Microhardness Anisotropy in (Pb,Cd)Te Solid Solution Crystallizing in the Rock Salt Structure and Containing 5% of Cd

et al. 2017

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“…One can improve the mechanical properties of a given semiconductor by the crystal doping or alloying with another compound. Several further reports were devoted to the mechanical properties of solid solutions grown on the basis of PbTe, like, e.g., (Pb,Ge)Te or (Pb,Cd)Te (see [13][14][15][16][17] and references therein). However, such basic experimental data as anisotropy of Young's modulus (E) and that of the hardness (H) are not available for such "classical" material as PbTe.…”

Section: Introductionmentioning

confidence: 99%

Anisotropy of Young's Modulus and Microhardness of PbTe

et al. 2018

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Nanoindentation measurements were performed for a single PbTe crystal grown by self-selecting vapour growth method and characterized by X-ray diffraction. The microhardness and Young's modulus were determined for a few loads applied along the [001], [011] and [111] high symmetry directions for carefully oriented, 2 mm thick crystal plates. An anisotropy of two parameters has been suggested and compared with available literature data. The present results qualitatively confirm the theoretical predictions for a rock salt type crystal (PbS). The microhardness anisotropy value is in an agreement with recently determined, relevant value for (Pb,Cd)Te solid solution.

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“…[3], selected preliminary results of these studies can be found in Ref. [12]. In the meantime we decided to check if the IXS technique is suitable also for the accurate determination of the low-frequency phonon dispersion, observed in compounds composed of heavy elements.…”

Section: Introductionmentioning

confidence: 99%

Inelastic X-Ray Scattering Studies of Phonon Dispersion in PbTe and (Pb,Cd)Te Solid Solution

et al. 2016

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PbTe and its solid solution (Pb,Cd)Te containing 2% of CdTe and PbTe grown by self-selecting vapour growth technique were investigated by inelastic X-ray scattering using synchrotron radiation. The ID28 beamline at ESRF with the incident photon energy of 17794 eV and the energy resolution of 3 meV was applied for that purpose. The measurements were performed at room temperature along [001]-type high symmetry direction in the Brillouin zone. In spite of a very low energy of phonon branches they can be determined by inelastic X-ray scattering with a high accuracy. The transversal acoustic phonon dispersion obtained by inelastic X-ray scattering corresponds well to those resulting from inelastic neutron scattering measurements and ab initio calculations. Apart from expected structures corresponding to the bulk phonons an additional scattering related to the crystal surface properties was observed in the inelastic X-ray scattering spectra. The analysis performed with the use of secondary ion mass spectroscopy technique demonstrated a presence of a thin oxide layer at sample surfaces.

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Hardening of (Pb,Cd)Te Crystal Lattice with an Increasing CdTe Content in the Solid Solution

Cited by 8 publications

References 16 publications

The Young Modulus and Microhardness Anisotropy in (Pb,Cd)Te Solid Solution Crystallizing in the Rock Salt Structure and Containing 5% of Cd

The Young Modulus and Microhardness Anisotropy in (Pb,Cd)Te Solid Solution Crystallizing in the Rock Salt Structure and Containing 5% of Cd

Anisotropy of Young's Modulus and Microhardness of PbTe

Inelastic X-Ray Scattering Studies of Phonon Dispersion in PbTe and (Pb,Cd)Te Solid Solution

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