2018
DOI: 10.12693/aphyspola.134.941
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Anisotropy of Young's Modulus and Microhardness of PbTe

Abstract: Nanoindentation measurements were performed for a single PbTe crystal grown by self-selecting vapour growth method and characterized by X-ray diffraction. The microhardness and Young's modulus were determined for a few loads applied along the [001], [011] and [111] high symmetry directions for carefully oriented, 2 mm thick crystal plates. An anisotropy of two parameters has been suggested and compared with available literature data. The present results qualitatively confirm the theoretical predictions for a r… Show more

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Cited by 7 publications
(7 citation statements)
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“…Taking into account that the maximum nanoindentation depth for the lowest applied maximum load is of the order of 100 nm or even slightly smaller the quantitative value of nanohardness anisotropy determined for relatively small maximum loads should be considered with some caution. A significant dependence of H on applied load maximum was not observed, present data corresponding, for example, to 10 mN does not differ a lot from values determined previously for much lower maximum load . The obtained nanohardness anisotropy determined for bulk PbTe crystals can be compared with those, previously determined for bulk (Pb,Cd)Te solid solution crystals, containing 5% of CdTe .…”
Section: Resultssupporting
confidence: 66%
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“…Taking into account that the maximum nanoindentation depth for the lowest applied maximum load is of the order of 100 nm or even slightly smaller the quantitative value of nanohardness anisotropy determined for relatively small maximum loads should be considered with some caution. A significant dependence of H on applied load maximum was not observed, present data corresponding, for example, to 10 mN does not differ a lot from values determined previously for much lower maximum load . The obtained nanohardness anisotropy determined for bulk PbTe crystals can be compared with those, previously determined for bulk (Pb,Cd)Te solid solution crystals, containing 5% of CdTe .…”
Section: Resultssupporting
confidence: 66%
“…A slightly higher value 58.86 GPa corresponded to hot extruded samples . Some noticeably higher values (from about 65 GPa to 70 GPa) were recently reported for single crystal PbTe grown by SSVG method …”
Section: Introductionmentioning
confidence: 52%
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“…The purpose of this operation is to remove the layer of TE materials damaged during cutting of the samples and to obtain the necessary surface roughness, which plays an important role in the adhesion strength of the deposited film. Mechanical treatment of TE materials is not an easy task, since the majority of thermoelectric materials are soft, with a microhardness of 25 to 70 kg/mm 2 [21,[33][34][35][36][37][38][39][40]. This greatly complicates the grinding and polishing of TE materials.…”
Section: Preparation Of Samples Of Te Materialsmentioning
confidence: 99%