2003
DOI: 10.1016/s0169-4332(02)01424-1
|View full text |Cite
|
Sign up to set email alerts
|

Hafnium oxide layers derived by photo-assisted sol–gel processing

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

0
14
0

Year Published

2005
2005
2021
2021

Publication Types

Select...
8

Relationship

0
8

Authors

Journals

citations
Cited by 25 publications
(14 citation statements)
references
References 13 publications
0
14
0
Order By: Relevance
“…Several techniques have been taken into consideration for the preparation of HfO 2 films for COMOS devices, including atomic layer deposition (ALD) [10][11][12][13][14][15][16][17], photo-assisted layer deposition [18], evaporation with ion assisted deposition, sputtering [19][20][21][22], chemical vapor deposition, metalorganic chemical vapor deposition (MOCVD) [23] standard thermal evaporation [24] and molecular beam epitaxy (MBE) [9]. All these techniques require high temperature treatments which usually induce a deterioration of the device performance and reliability.…”
Section: Introductionmentioning
confidence: 99%
“…Several techniques have been taken into consideration for the preparation of HfO 2 films for COMOS devices, including atomic layer deposition (ALD) [10][11][12][13][14][15][16][17], photo-assisted layer deposition [18], evaporation with ion assisted deposition, sputtering [19][20][21][22], chemical vapor deposition, metalorganic chemical vapor deposition (MOCVD) [23] standard thermal evaporation [24] and molecular beam epitaxy (MBE) [9]. All these techniques require high temperature treatments which usually induce a deterioration of the device performance and reliability.…”
Section: Introductionmentioning
confidence: 99%
“…6a. The films deposited at 400 and 450 • C present broadband centered approximately at 3400 cm −1 due to O-H type bonds [36,37]. This same band appears slightly on those films deposited at 500 and 550 • C. The bands located at 1510 and 1410 cm −1 correspond to vibrational modes of the asymmetric stretching of carbonyl CO(vas).…”
Section: Infrared (Ir) Spectra Analysismentioning
confidence: 85%
“…The main peak located at 530.7 eV is attributed to hafnium dioxide at the surface [32]. The peak at 531.8 is suggested to correspond to physisorbed water or -OH groups [17,33], and the peak at 533.8 may be attributed to C-O bonds [32]. After thermal treatment at 500°C, it can be seen that the peak located at 533.8 eV disappeared, but the physisorbed water or -OH still existed at the surface of the films, and the intensity decreased very rapidly.…”
Section: Characterization Of Zirconium Oxide Thin Filmsmentioning
confidence: 99%
“…In turn, these parameters are controlled by synthesis conditions. Photo-assisted processes have received some attention in recent years, for the deposition of HfO 2 and ZrO 2 films, and have been applied in CVD [14,15] and sol-gel [16,17] methods.…”
Section: Introductionmentioning
confidence: 99%