2010 15th Asia and South Pacific Design Automation Conference (ASP-DAC) 2010
DOI: 10.1109/aspdac.2010.5419843
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Guided gate-level ATPG for sequential circuits using a high-level test generation approach

Alizadeh Alizadeh1,
Katsuhide Fujita2
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Cited by 7 publications
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