2007
DOI: 10.1016/j.susc.2006.11.044
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Growth of thin silver films on silicon oxide pretreated by low temperature argon plasma

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Cited by 8 publications
(4 citation statements)
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“…Between 70% and 100% the nanocrystals stay in contact which provides an electrical pathway for the electrons. At 100%, the silver layer has a sheet resistivity of 1 Ω.sq, which is consistent with the literature [7]. On the contrary, below a silver ratio of 70%, the amorphous WO3 disconnects the nanocrystals one from another, which causes an increase of the sheet resistivity.…”
Section: Electrical Studysupporting
confidence: 90%
“…Between 70% and 100% the nanocrystals stay in contact which provides an electrical pathway for the electrons. At 100%, the silver layer has a sheet resistivity of 1 Ω.sq, which is consistent with the literature [7]. On the contrary, below a silver ratio of 70%, the amorphous WO3 disconnects the nanocrystals one from another, which causes an increase of the sheet resistivity.…”
Section: Electrical Studysupporting
confidence: 90%
“…With increasing oxygen flow rate, the top SiON layer sputtered on the Ag layer exhibited rough surface due to transition from continuous layer to randomly connected dots or islands. In addition, the percolation threshold is reduced and the coalescence commences at lower film thickness for Ag with a reduced oxygen concentration as reported by Romanyuk et al 20 Therefore, based on the XPS depth profile and HREM results, the different electrical properties of the SiON/Ag/SiON multilayer caused by the oxygen flow rate during the continuous sputtering process can be explained by the difference in connectivity of the Ag layer within the SiON/Ag/SiON multilayer. At low oxygen flow rates, the Ag metal existed as a type of continuously connected layer, and therefore acted as the main current path in the metallic SiON/Ag/SiON multilayer; however, at high oxygen flow rates, unconnected Ag dots or islands were formed by intense Ar plasma etching and consequently destroyed the former current path.…”
supporting
confidence: 59%
“…There is a tradeoff in determining the thickness of the semitransparent Ag cathode. The optical transmittance decreased, but the conductivity increased, with increasing Ag thickness [12,13,33,34]. In our experiments, it was found that 15 nm was the thinnest value for which Ag formed a connecting network and exhibited the highest optical transmittance (38.8% at 550 nm) and an acceptable resistivity (2.30 × 10 −4 cm 2 m −1 , comparable to 100 nm Ag with 1.49 × 10 −4 cm 2 m −1 ).…”
Section: Methodsmentioning
confidence: 50%