2016
DOI: 10.1016/j.materresbull.2015.12.012
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Growth of boron doped hydrogenated nanocrystalline cubic silicon carbide (3C-SiC) films by Hot Wire-CVD

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Cited by 17 publications
(10 citation statements)
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“…FTIR spectroscopy showed a single strong absorption peak at ~760 cm −1 for all synthesized SiC, corresponding to Si–C stretching mode [ 32 , 33 ]. As shown in Figure 5 a, upon increasing annealing temperature, T A , three notable changes in the absorption spectra were observed: (1) A shift in peak position towards 800 cm −1 ( Figure 5 a), which corresponds to the stretching mode of Si–C bond in crystalline SiC [ 33 , 34 ], (2) substantial narrowing of the full width at half maximum (FWHM) ( Figure 5 b) and, (3) a change in line shape from Gaussian to Lorentzian.…”
Section: Resultsmentioning
confidence: 99%
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“…FTIR spectroscopy showed a single strong absorption peak at ~760 cm −1 for all synthesized SiC, corresponding to Si–C stretching mode [ 32 , 33 ]. As shown in Figure 5 a, upon increasing annealing temperature, T A , three notable changes in the absorption spectra were observed: (1) A shift in peak position towards 800 cm −1 ( Figure 5 a), which corresponds to the stretching mode of Si–C bond in crystalline SiC [ 33 , 34 ], (2) substantial narrowing of the full width at half maximum (FWHM) ( Figure 5 b) and, (3) a change in line shape from Gaussian to Lorentzian.…”
Section: Resultsmentioning
confidence: 99%
“…Additionally, strong overlap for the Si 2p binding energy between the annealed SiC and a 3C–SiC standard at ~100.3 eV confirms the chemical bonding of the synthesized materials and NWs are indeed Si–C ( Figure 5 f). The absence of XPS Si 2p peak around ~98.5 and ~103 eV, corresponding to Si–Si and Si–O bonds respectively [ 32 ], also ruled out the possibility of silicon or carbon nanocluster formation, as well as any oxidation.…”
Section: Resultsmentioning
confidence: 99%
“…The composition of applied SiC NPs was characterized by the XRD results as shown in Figure 1 a. SiC NPs were proved to belong to the beta crystalline form and they possessed a structure of a cubic crystal system, based on MDI Jade 5.0 analysis software (standard card number is JCPDS 29-1129 for present 3C-SiC). The diffraction angles (2-theta) at 36°, 41.6°, 60°, 72°, and 75.8° should be assigned to crystal indices of (111), (200), (220), (311), and (222) for beta-SiC, respectively [ 32 ]. The 2-theta at 34° should be ascribed to the stacking faults formed in beta-SiC crystal [ 33 ].…”
Section: Resultsmentioning
confidence: 99%
“…It is also found that the incorporation of impurities hinders the grain growth, and the grain size decreases for an increasing doping concentration. [13,17,22] Combining high nitrogen doping, a rather low F MMS and a reduced d f-s a conductivity of σ = 14 S cm À1 could be achieved by Pomaska. [13] For high doping concentrations, it was not possible to extract an E 04 because α was always above 10 4 cm À1 .…”
Section: Doping In Nanocrystalline Silicon Carbidementioning
confidence: 99%