1977
DOI: 10.1002/pssa.2210430129
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Growth-induced magnetic anisotropy of (Sm, Ga)-substituted YIG films grown on {111} substrates

Abstract: The growth‐induced anisotropy K ug of Y3−ySmy Fe5−xGaxO12 films grown by liquid phase epitaxy on {111} GGG substrates is investigated. The growth rate v and not the growth temperature TG is found to be of primary importance for K ug of films grown from the same melt. The observed dependence of K ug on the samarium content y and on the growth rate v can be satisfactorily described by a model based on growth kinetics and site preference.

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Cited by 14 publications
(5 citation statements)
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“…The critical gallium content of the transition from in-plane to perpendicular, however, depends on further parameters too, in particular on the layer thickness and misfit. With increasing undercooling the increasing bismuth content leads to a higher misfit stress -as discussed before -and with that to a tendency to out-ofplane layers, as has been shown by Linzen et al [24].…”
Section: Layer Properties and Misfitmentioning
confidence: 73%
“…The critical gallium content of the transition from in-plane to perpendicular, however, depends on further parameters too, in particular on the layer thickness and misfit. With increasing undercooling the increasing bismuth content leads to a higher misfit stress -as discussed before -and with that to a tendency to out-ofplane layers, as has been shown by Linzen et al [24].…”
Section: Layer Properties and Misfitmentioning
confidence: 73%
“…53 K G , the fourth term, represents a uniaxial growth-induced anisotropy that originates from preferential occupancy of cations or vacancies in nonequivalent sites. 14,15,54,55 Surface and interface anisotropies 56 may also contribute to K u . All of the films in this study exhibited PMA.…”
Section: Characterizationmentioning
confidence: 99%
“…c 44 is the shear modulus of the film and its value lies between 74 and 90 GPa for REIGs ,,, Surface and interface anisotropies may also contribute to K u .…”
Section: Structural and Magnetic Characterizationmentioning
confidence: 99%
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