Growth and structural characterization of epitaxial Cu/Nb multilayers

Plasticity in the nanoscale Cu/Nb single-crystal multilayers as revealed by synchrotron Laue x-ray microdiffraction

“…However, as inherent in the tensile deformation mode of materials, samples would be more prone to fracture (as opposed to in compression deformation) before much plasticity could be studied. This is especially true for the multilayers with individual layer thickness smaller than 30 nm as was observed by Aydiner et al 8,9 Our most recent success in growing nanoscale singlecrystal metallic multilayered composite materials 10 thus combined with the synchrotron-based Laue microdiffraction technique utilizing a focused x-ray beam into the submicron scale (i.e., hundreds of nanometers) of white beam (polychromatic) radiation 11,12 and the recent advances in micropillar compression testing in a synchrotron beamline setup 13,14 would finally enable us to do experiments with significantly fewer shortcomings of the above previous studies. [6][7][8][9] The micropillar compression setup enables us to experiment with nanolayers of less than 30-nm individual layer thickness.…”

Fabrication, microstructure, and mechanical properties of tin nanostructures

“…Since geometrically necessary dislocations (GNDs) are directly related to the local lattice curvature, this technique can be used to determine the density of GNDs [45,46]. This has proven to be useful in the study of length scale effects involving uniaxially compressed submicron pillars of single-crystalline gold [47], nanoindented bulk copper single crystals [48], low melting temperature electroplated indium nanopillars [33], and nanoscale Cu/Nb single-crystalline multilayer materials [49]. The symmetric broadening of the Laue diffraction peaks, in the mean time, is useful to provide an indication of the relative of statistically stored dislocations (SSDs) [50].…”

Size effect on mechanical behavior of Al/Si3N4 multilayers by nanoindentation

“…However, when the layer thickness is further decreased to the range of 10-50 nm, there is not enough space to accommodate dislocation pileup in the individual layers, and Orowan-type bowing of individual dislocations becomes dominated and the increase of strength follows with t b t ln / / flow σ ∝ ( ) [8]. The statistically-stored dislocations and geometrically-necessary dislocations were studied with the metallic multilayers (Cu/Nb) and nanostructures (Sn nanopillars) composites the synchrotron X-ray microdiffraction technique [45][46][47][48][49].…”