Plasticity in the nanoscale Cu/Nb single-crystal multilayers as revealed by synchrotron Laue x-ray microdiffraction

Abstract

Abstract

Load Sharing Phenomena in Nanoscale Cu/Nb Multilayers

“…The main sources of larger peak breadths are smaller grains, microstrain, and accumulated plastic deformation. [18] The increasing peak breadth may not be made apparent in freestanding layers, since the failure of the Cu layers would result in failure of the entire sample. During deformation, the Cu peak breadth curves reached plateaus at strains that were close to the failure strains, as pointed out by arrows for Cu2/Nb10, Cu5/Nb10, and Cu10/Nb10.…”

“…[4,5] However, as the individual layer thicknesses decrease below 20 nm, the deformation behavior becomes more difficult to observe. [9,[11][12][13][14][15][16] NMMs with layer thicknesses of approximately 20 nm have been previously studied, although the influence of layer thickness was not investigated, [17,18] while a study of W/Cu NMMs with varying layer thicknesses focused on the elastic properties and interfacial mixing in the samples. [6,7] However, other in situ techniques are needed to characterize the global behavior of these materials.…”

Thermomechanical residual stress evaluation in multi-crystalline silicon solar cells of photovoltaic modules with different encapsulation polymers using synchrotron X-ray microdiffraction

“…A detailed description of the microdiffraction beamline is given elsewhere [14][15][16][17]. The efficacy of synchrotron X-ray diffraction in enabling technologically important innovations, including in microelectronics and nanotechnology industries, in additions to next generation silicon solar PV technologies, have recently been reported and described elsewhere [18][19][20][21][22] Figure 2a shows the schematic of the microdiffraction experiment setup and an actual picture of the setup is shown in Figure 2b. The sample was mounted on the stage with its back (Figure 1b) facing the X-ray beam, as X-rays cannot penetrate the front glass due to absorption.…”

X-Ray Diffraction Studies of Forward and Reverse Plastic Flow in Nanoscale Layers During Thermal Cycling

“…X-ray diffraction provides an established method to measure the evolution of lattice strains during deformation. It has been used ex situ for pre and post micropillar compression testing [10] and in situ for tensile testing of freestanding Cu/Nb multilayer thin films. [11] Grazing incidence X-ray diffraction provides direct measurement of in-plane lattice parameters, from which in-plane elastic strain (and stress) can be determined.…”