2005
DOI: 10.1149/1.2017936
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Growth and Density Time Dependence of Electroless Cu Films Deposited onto Au Using Cu-EDTA-HCHO Bath

Abstract: This article reports on the growth and density time dependence of electroless copper films deposited onto smooth gold surfaces as the fundamental background for studies of electroless copper morphology. Al/Au/Ti/Si͑100͒ substrates were immersed in an alkaline electroless copper bath ͑0.04 M CuSO 4 , 0.08 M ethylenediaminetetraacetic acid ͑EDTA͒, 0.004−0.24 M HCHO, 0.0004 M 2,2Ј-dipridyl͒ in order to obtain plated continuous films. Changing the HCHO concentration in the range of 0.04-0.24 M, both deposition rat… Show more

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“…Unlike chemical deposition of a Cu nanofilm on Ge in which the growth of a conductive and SEIRA-active Cu nanofilm occurs by the continuous dissolution of the Ge substrate via the displacement of Ge with Cu [41], our current approach allows a Cu nanofilm on Si to be deposited via initial activation with Cu seeds followed by its further growth in a Cu chemical plating bath without continuous dissolution of Si substrate. It should be emphasized that our seeded-growth tactics is quite different from that aimed for microelectronics application in which Pd [42] or Au [43] seeds were introduced to Si wafer surfaces as the catalysts, thus preventing possible contamination in the resultant Cu nanofilm electrode by a second metal.…”
Section: Introductionmentioning
confidence: 99%
“…Unlike chemical deposition of a Cu nanofilm on Ge in which the growth of a conductive and SEIRA-active Cu nanofilm occurs by the continuous dissolution of the Ge substrate via the displacement of Ge with Cu [41], our current approach allows a Cu nanofilm on Si to be deposited via initial activation with Cu seeds followed by its further growth in a Cu chemical plating bath without continuous dissolution of Si substrate. It should be emphasized that our seeded-growth tactics is quite different from that aimed for microelectronics application in which Pd [42] or Au [43] seeds were introduced to Si wafer surfaces as the catalysts, thus preventing possible contamination in the resultant Cu nanofilm electrode by a second metal.…”
Section: Introductionmentioning
confidence: 99%