2006
DOI: 10.1063/1.2194387
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Gettering of transition metal impurities during phosphorus emitter diffusion in multicrystalline silicon solar cell processing

Abstract: We have investigated the gettering of transition metals in multicrystalline silicon wafers during a phosphorus emitter diffusion for solar cell processing. The results show that mainly regions of high initial recombination lifetime exhibit a significant lifetime enhancement upon phosphorus diffusion gettering. Nevertheless, transition metal profiles extracted by secondary ion mass spectrometry in a region of low initial lifetime reveal significant gradients in Cr, Fe, and Cu concentrations towards the surface … Show more

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Cited by 98 publications
(62 citation statements)
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“…1, the saturation condition was reached for all samples #1 to #3 (i.e. for all temperatures in the range studied) measuring a surface P concentration in the range of 3-5 x 10 20 cm -3 , in agreement with values reported in the literature for the solid solubility of P in Si in this range of temperature [21,22].…”
Section: Phsupporting
confidence: 78%
“…1, the saturation condition was reached for all samples #1 to #3 (i.e. for all temperatures in the range studied) measuring a surface P concentration in the range of 3-5 x 10 20 cm -3 , in agreement with values reported in the literature for the solid solubility of P in Si in this range of temperature [21,22].…”
Section: Phsupporting
confidence: 78%
“…A strong correlation is seen between precipitation site density and low [Fe,] because Fe,-internally getters to and precipitates at the structural defects as the silicon cools during crystallization. In all Models, regions of higher structural defect density and thus nucleation site density contain more precipitated iron after crystallization, as observed experimentally [15,68,69]. During subsequent processing steps, precipitated iron can reduce device performance because precipitates can limit the lifetime [20] and dissolving precipitates release Fe, into the bulk [69][70][71].…”
Section: Crystallizationmentioning
confidence: 71%
“…14 Sch€ on et al found that minority carrier lifetime increased and [Cr i ] decreased after phosphorous diffusion gettering. 13 Other quantitative studies of the effect of phosphorous diffusion gettering have measured high chromium concentrations at near-surface regions, suggesting external gettering, [15][16][17] as well as a reduction of the total bulk chromium concentration. 18 For this study, two adjacent (sister) wafers were selected from a 12 kg laboratory-scale intentionally chromiumcontaminated mc-Si ingot.…”
mentioning
confidence: 99%
“…13,[15][16][17][18] Lifetimes (Cr i , Dn ¼ 10 15 cm À3 ) and interstitial concentrations as measured by quasi-steady-state photoconductance (QSSPC) before and after gettering are shown in Fig. 3.…”
mentioning
confidence: 99%
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