The thermal stability and reaction with H 2 of the surface of a (10 1 12) R-plane sapphire substrate at high temperatures were investigated using an in situ gravimetric monitoring system. Although the R-plane sapphire surface was stable up to 1400 C in an inert carrier gas, decomposition started at 1200 C in H 2 carrier gas. In addition, the activation energy for the decomposition of R-plane sapphire in H 2 carrier gas changed at approximately 1300 C, which indicates that the rate-limiting reaction for the decomposition of the R-plane sapphire substrate shifts near 1300 C. These results agree with those for the stability of the C-plane sapphire substrate, as described previously. However, it was found that decomposition rate of the R-plane sapphire substrate was significantly greater than that for the C-plane substrate. The relationship between the decomposition rate and the surface orientation of sapphire and detailed mechanisms for the decomposition of R-and C-plane sapphire in H 2 carrier gas are discussed.