2001
DOI: 10.1557/proc-692-h4.5.1
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GaAs Photodetector for X-ray Imaging

Abstract: We describe briefly a cheap and non polluting technique to grow epitaxial GaAs layers, several hundred microns thick, in a matter of hour. Detectors consisting of a p+/i/n+ structure have been realised with these layers and we present their characteristics obtained from currentvoltage, capacitance-voltage measurements as well as their response versus the energy and flux of X-rays.

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Cited by 2 publications
(2 citation statements)
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“…The fabrication of these detectors and their performances were given earlier [6][7][8]. The concentration of the residual doping impurities is obtained from the analysis [9] of the capacitance-voltage characteristics.…”
Section: Methodsmentioning
confidence: 99%
“…The fabrication of these detectors and their performances were given earlier [6][7][8]. The concentration of the residual doping impurities is obtained from the analysis [9] of the capacitance-voltage characteristics.…”
Section: Methodsmentioning
confidence: 99%
“…[15][16][17] The aim of this communication is to describe some of the properties of these detectors that are important for imaging, namely the linearity of the response, the charge-induced polarization, and the afterglow effect. [15][16][17] The aim of this communication is to describe some of the properties of these detectors that are important for imaging, namely the linearity of the response, the charge-induced polarization, and the afterglow effect.…”
mentioning
confidence: 99%