1996
DOI: 10.1016/0169-4332(96)00280-2
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Ga migration process in Au film on (100) GaAs under temperature treatment in vacuum

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Cited by 9 publications
(1 citation statement)
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“…In this paper we present results of photometric measurements, used earlier on GaAs and Si [6][7][8] for the determination of the amount of "free" or "non-interconnected" Si and B, produced at the surface of single-crystalline silicon as a result of the RTD process. We also present additional supporting measurements on these samples using SIMS and SEM.…”
Section: Introductionmentioning
confidence: 99%
“…In this paper we present results of photometric measurements, used earlier on GaAs and Si [6][7][8] for the determination of the amount of "free" or "non-interconnected" Si and B, produced at the surface of single-crystalline silicon as a result of the RTD process. We also present additional supporting measurements on these samples using SIMS and SEM.…”
Section: Introductionmentioning
confidence: 99%