International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217)
DOI: 10.1109/iedm.1998.746373
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Future directions for DRAM memory cell technology

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Cited by 29 publications
(17 citation statements)
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“…A RAM cell (a) uses three transistor dynamic random access memory (DRAM) scheme; however, four-transistor static RAM (SRAM) scheme can also be applied. Conventional one-transistor one-capacitor memory cell currently used in MOS DRAMs [56] would not be suitable for molecular memories, because of the difficulty in sustaining large capacitance in a molecule. ROM cell (b) stores charge in the gate region of the control transistor.…”
Section: ) Switching Using Single Electron Transfer Principlesmentioning
confidence: 99%
“…A RAM cell (a) uses three transistor dynamic random access memory (DRAM) scheme; however, four-transistor static RAM (SRAM) scheme can also be applied. Conventional one-transistor one-capacitor memory cell currently used in MOS DRAMs [56] would not be suitable for molecular memories, because of the difficulty in sustaining large capacitance in a molecule. ROM cell (b) stores charge in the gate region of the control transistor.…”
Section: ) Switching Using Single Electron Transfer Principlesmentioning
confidence: 99%
“…As the device dimensions are scaled down, the capacitance volume is reduced and the restore electric charge is decreased. Both stacked capacitor (STC) cell and trench capacitor (TRC) cell can help to solve this problem [1], but their fabrication processes are too complex to scale down. Hence, the SOI 1T-DRAM was proposed due to its capacitorless structure with simple process, low fabrication cost, and increased integrated density [2][3][4].…”
Section: Introductionmentioning
confidence: 99%
“…Present DRAM chips in production integrate a 1-transistor, 1-capacitor (1T/1C) cell having an area of 8 [1]. Experimental 1T/1C cells having an area of 6 or even 4 have been proposed [2], [3], but for all 1T/1C cells, the main challenge in cell area reduction lies with the capacitor integration. Indeed for each memory generation, a constant capacitance value of 30 fF/cell is targeted [4].…”
Section: Introductionmentioning
confidence: 99%