Further investigation on laser-induced damage thresholds of camera sensors and micro-optomechanical systems

Schwarz, Bastian; Koerber, Michael; Ritt, Gunnar; Eberle, Bernd

doi:10.1117/12.2533142

Cited by 7 publications

(12 citation statements)

References 16 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Such damage thresholds for imaging sensors are usually not known and have to be determined by appropriate measurements, e.g., see the work of BECKER et. al [12,13], THÉBERGE et al [14], BURGESS et al [15], WESTGATE et al [16] and SCHWARZ et al [17][18][19]. In the next step, we had to transfer the image sensor's damage threshold to the corresponding value at the position of the camera lens' entrance aperture in order to achieve Objective 1.…”

Section: Approachmentioning

confidence: 99%

An approach for laser safety calculations for electro-optical imaging systems

Ritt,

Schwarz,

Eberle

et al. 2023

Technologies for Optical Countermeasures XIX

Self Cite

View full text Add to dashboard Cite

Laser safety with regard to the human eye is a well-known topic. Everybody working with laser sources has to follow the long-established occupational safety rules to prevent people from eye damage by accidental irradiation. These rules comprise, for example, the use of laser safety eye-wear and the calculation of the Maximum Permissible Exposure (MPE) and its corresponding hazard distance, the Nominal Ocular Hazard Distance (NOHD). At exposure levels below the MPE, glare effects may occur if the laser wavelengths are in the visible spectral range. The physical effects of laser dazzling on the human eye are described by a quite new concept, which defines the Maximum Dazzle Exposure (MDE) and the corresponding Nominal Ocular Dazzle Distance (NODD).Triggered by the MDE/NODD concept, we investigated whether similar laser safety calculations could be performed for electro-optical imaging systems. In this publication, we will review our approach for laser safety calculations for such systems. We have succeeded to find closed-form equations allowing calculations of exposure limits to prevent electrooptical imaging systems from damage and/or dazzle. Furthermore, we found some interesting effects related to the corresponding hazard distances, which are also discussed.

show abstract

Section: Approachmentioning

confidence: 99%

An approach for laser safety calculations for electro-optical imaging systems

Ritt,

Schwarz,

Eberle

et al. 2023

Technologies for Optical Countermeasures XIX

Self Cite

View full text Add to dashboard Cite

show abstract

“…A few relevant studies of sensor damage are listed below: Schwarz et al have published several papers and proceedings on the LIDTs of camera sensors, most recently publishing the 527 nm picosecond thresholds of CCD and CMOS sensors at approximately 10 mJ/cm 2 [ 1 ]. Previous work by Schwarz et al found the 532 nm nanosecond thresholds of colour and monochrome CMOS and CCD sensors to range from 0.03 to 0.1 Jcm −2 [ 2 , 3 , 4 ]. Burgess et al published the continuous-wave LIDTs of visible and shortwave infrared cameras using a 1070 nm source and laser exposure times from microsecond to continuous wave [ 5 ].…”

Section: Introductionmentioning

confidence: 99%

“…Schwarz et al have published several papers and proceedings on the LIDTs of camera sensors, most recently publishing the 527 nm picosecond thresholds of CCD and CMOS sensors at approximately 10 mJ/cm 2 [ 1 ]. Previous work by Schwarz et al found the 532 nm nanosecond thresholds of colour and monochrome CMOS and CCD sensors to range from 0.03 to 0.1 Jcm −2 [ 2 , 3 , 4 ].…”

Section: Introductionmentioning

confidence: 99%

Visible-Band Nanosecond Pulsed Laser Damage Thresholds of Silicon 2D Imaging Arrays

Westgate

James

2022

Sensors

View full text Add to dashboard Cite

Laser-induced camera damage thresholds were measured for several sensors of three different sensor architectures using a Q-switched Nd:YAG laser in order to determine their pulsed laser-induced damage thresholds. Charge coupled device (CCD), front-side illuminated complimentary metal-oxide semiconductor (FSI CMOS), and back-side illuminated (BSI) CMOS sensors were assessed under laboratory and outdoor environments by increasing the focused laser intensity onto the sensors and recording the sensor output. The damage sites were classified qualitatively into damage types, and pixel counting methods were applied to quantitatively plot damage scale against laser intensity. Probit-fits were applied to find the intensity values where a 95% probability of damage would occur (FD95) and showed that FD95 was approximately the same under laboratory conditions for CCD, FSI CMOS, and BSI CMOS sensors (mean 532 nm FD95 of 0.077 ± 0.01 Jcm−2). BSI CMOS sensors were the most robust to large-scale damage effects—BSI sensor kill was found at approximately 103 Jcm−2, compared to 10 Jcm−2 for FSI CMOS, and between ~1.6 and 2.7 Jcm−2 for CCDs.

show abstract

“…To establish laser safety quantities for sensors analogous to the human eye (exposure limit MPE and hazard distance NOHD), we had to start from the damage threshold of the sensor, which is located at the focal plane of the camera lens. Such laser-induced damage thresholds (LIDT) for imaging sensors are normally not known and have to be determined by appropriate measurements, e.g., see the work of Schwarz et al [ 15 , 16 , 17 ]. In a further step, we had to transfer the sensor’s damage threshold to a corresponding value at the position of the camera lens’ entrance aperture in order to achieve Objective 1.…”

Section: Introductionmentioning

confidence: 99%

“…While estimates for the saturation threshold

of a sensor can be derived from the sensor specifications, this is usually not possible for laser damage thresholds

. However, such values may be found in the literature, e.g., [ 15 , 16 , 17 , 18 , 19 ].…”

Section: Introductionmentioning

confidence: 99%

Estimation of Lens Stray Light with Regard to the Incapacitation of Imaging Sensors—Part 2: Validation

Schwarz

Ritt

Eberle

2022

Sensors

View full text Add to dashboard Cite

Recently, we developed a simple theoretical model for the estimation of the irradiance distribution at the focal plane of commercial off-the-shelf (COTS) camera lenses in case of laser illumination. The purpose of such a model is to predict the incapacitation of imaging sensors when irradiated by laser light. The model is based on closed-form equations that comprise mainly standard parameters of the laser dazzle scenario and those of the main devices involved (laser source, camera lens and imaging sensor). However, the model also includes three non-standard parameters, which describe the scattering of light within the camera lens. In previous work, we have performed measurements to derive these typically unknown scatter parameters for a collection of camera lenses of the Double-Gauss type. In this publication, we compare calculations based on our theoretical model and the measured scatter parameters with the outcome of stray light simulations performed with the optical design software FRED in order to validate the reliability of our theoretical model and of the derived scatter parameters.

show abstract

Further investigation on laser-induced damage thresholds of camera sensors and micro-optomechanical systems

Cited by 7 publications

References 16 publications

An approach for laser safety calculations for electro-optical imaging systems

An approach for laser safety calculations for electro-optical imaging systems

Visible-Band Nanosecond Pulsed Laser Damage Thresholds of Silicon 2D Imaging Arrays

Estimation of Lens Stray Light with Regard to the Incapacitation of Imaging Sensors—Part 2: Validation

Contact Info

Product

Resources

About