2009
DOI: 10.1016/j.mee.2008.11.029
|View full text |Cite
|
Sign up to set email alerts
|

Fundamental size limitations of micro four-point probes

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

1
6
0

Year Published

2011
2011
2024
2024

Publication Types

Select...
8
1

Relationship

1
8

Authors

Journals

citations
Cited by 14 publications
(7 citation statements)
references
References 14 publications
1
6
0
Order By: Relevance
“…Our best fit contact radii (r 0 ), while technically representing a method-specific parameter rather than any useful sample-probe interaction, are nevertheless consistent with scanning electron microscopy estimates (e.g., Ref. 19).…”
Section: B Determination Of Thermal Propertiessupporting
confidence: 86%
See 1 more Smart Citation
“…Our best fit contact radii (r 0 ), while technically representing a method-specific parameter rather than any useful sample-probe interaction, are nevertheless consistent with scanning electron microscopy estimates (e.g., Ref. 19).…”
Section: B Determination Of Thermal Propertiessupporting
confidence: 86%
“…Traditionally, the unintentional generation of Joule heat during electrical microprobing has been mitigated via, e.g., measurement at sufficiently low 14,18 or transient/pulsed currents 17 and/or via optimization of the probing geometry. 18,19 In a recent paradigm shift, we demonstrated 9 that the seemingly undesired heating at such scales is highly reproducible and may be intentionally amplified in order to quantify the thermal properties of the material stack under test. Figure 1 summarizes the key highlights from Ref.…”
Section: Introductionmentioning
confidence: 99%
“…The four probes were placed in a straight line at equal distance from one another on the sample. During the test, a current was passed through the two outer probes and the potential difference measured across the two inner probes was used to calculate the resistance value [32]. The thickness was measured with a confocal microscope (Carl Zeiss: Axio CSM 700, Jena, Germany) to convert resistance into resistivity.…”
Section: Solid Fraction Characterizationmentioning
confidence: 99%
“…In this paper, the direct current (DC) electrical resistance conductivities of the BP sensors were obtained using commercial four-probe resistance measuring apparatus (RTS-8, 4 PROBESTECH, China), which is an established method for measuring the electrical properties of solids and thin lms in material science. 23,24 The relative resistance change DR/R 0 is used to describe the sensitivity of the BP sensors, where DR and R 0 are resistance change and initial resistance at room temperature. The initial electrical resistance of the BP sensor was 2.26 U.…”
Section: Piezoresistivity Evaluation Of the Bp Sensors In Resin Phasementioning
confidence: 99%