FPT: An Integrated Fundamental Parameters Program for Broadband EDXRF Analysis without a Set of Similar Standards

Gedcke, D. A.; Byars, L.G.; Jacobus, N.C.

doi:10.1007/978-1-4613-3727-0_49

Cited by 7 publications

(1 citation statement)

References 12 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The ZAF II program was used to determine elemental compositions. 12 The program includes automatic background subtraction, peak overlap correction including escape peaks, detector efficiency correction, and relative atomic, absorption, and fluorescence corrections. A 99.99% pure Au plate attached to one of the Ta sheet clips provided a reference for accurate calibration of the EDX energy scale.…”

Section: Methodsmentioning

confidence: 99%

Real-time scanning electron microscopy and auger spectroscopy of wetting in Sn-3.3Ag-4.8Bi solder paste wetted to Ni-Au

Bozack

Johnson

2005

Journal of Elec Materi

View full text Add to dashboard Cite

Surface and thin film techniques reveal an immediate and intense surface reaction during wetting of Sn-3.3Ag-4.8Bi solder paste to Ni-Au board finishes. Rutherford backscattering spectroscopy (RBS) shows that a typical, vendorsupplied Ni-Au board finish consists of ϳ750 Å of Au above the Ni. Stylus profilometry indicates that the finish surface is rough with average vertical height variations of ϳ1-2 µm. The board finish seen by the solder alloy during wetting contains a large ϳ45% atom fraction of adventitious surface C observed by Auger spectroscopy (AES). The AES and energy-dispersive x-ray spectroscopy (EDX) indicates that Ni has fully intermixed throughout the alloy within seconds of wetting. Dissolution of the Au cap layer into the alloy and Bi and Ag surface segregation is observed. Auger point analysis and maps at the leading edge of the wetting front show no evidence of flux advance ahead of the alloy. Bismuth does not move out with the spreading wetting front. A unique feature of this work is the acquisition of real-time, in-situ electron microscopic observations of the spreading Sn-3.3Ag-4.8Bi alloy front across the Ni-Au substrate during wetting. The observations have been recorded on videotape and converted into computer files accessible on the World Wide Web with standard media players (ftp: //131.204.44.20).

show abstract

Section: Methodsmentioning

confidence: 99%

Real-time scanning electron microscopy and auger spectroscopy of wetting in Sn-3.3Ag-4.8Bi solder paste wetted to Ni-Au

Bozack

Johnson

2005

Journal of Elec Materi

View full text Add to dashboard Cite

show abstract

Matrix corrections for quantitative determination of trace elements in biological samples using energy‐dispersive X‐ray fluorescence spectrometry

et al. 1989

View full text Add to dashboard Cite

An experimental method for the evaluation of the matrix absorption correction (8) for the determination of trace elements in thick biological samples using EDXRF is discussed. The validity of the method was checked in two ways, first by comparing the experimental values with theoretical estimated values for samples of known matrix and second by analysing NBS biological standards in the form of thick pellets. It was found that a sample thickness of 40-70 mg is, in general, optimum for the analysis of biological samples in pellet form with an excitation energy of 22.6 keV.

show abstract

Use of Scattered Secondary Target Radiation in EDXRF Analysis: A Fundamental-Parameter Method for Matrix Correction

O’Reilly¹,

King²

1987

Advances in X-Ray Analysis

View full text Add to dashboard Cite

FPT: An Integrated Fundamental Parameters Program for Broadband EDXRF Analysis without a Set of Similar Standards

Cited by 7 publications

References 12 publications

Real-time scanning electron microscopy and auger spectroscopy of wetting in Sn-3.3Ag-4.8Bi solder paste wetted to Ni-Au

Real-time scanning electron microscopy and auger spectroscopy of wetting in Sn-3.3Ag-4.8Bi solder paste wetted to Ni-Au

Matrix corrections for quantitative determination of trace elements in biological samples using energy‐dispersive X‐ray fluorescence spectrometry

Use of Scattered Secondary Target Radiation in EDXRF Analysis: A Fundamental-Parameter Method for Matrix Correction

Contact Info

Product

Resources

About