Advances in X-Ray Analysis 1987
DOI: 10.1007/978-1-4613-1935-1_20
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Use of Scattered Secondary Target Radiation in EDXRF Analysis: A Fundamental-Parameter Method for Matrix Correction

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Cited by 5 publications
(2 citation statements)
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“…Certified reference materials (SGR1 River Sediment from the United States Geological Survey (USGS); SRM 2704 River Sediment and SRM 1646 Estuarine Sediment from the National Institute for Standards and Technology (NIST)) were also prepared as pressed pellets and used to calibrate the spectrometer and to determine the accuracy and precision of the overall procedure. Corrections for matrix effects were made by a calibration method (O'Reilly and King, 1986) that calculates the relation of the incoherent and coherent scattered radiation with the atomic number of the elements constituents of the sediments. Samples and certified reference materials were irradiated under different excitation conditions allowing the determination of a set of elements, amongst which the Br and Pb contents.…”
Section: Sediment Surface Samplesmentioning
confidence: 99%
“…Certified reference materials (SGR1 River Sediment from the United States Geological Survey (USGS); SRM 2704 River Sediment and SRM 1646 Estuarine Sediment from the National Institute for Standards and Technology (NIST)) were also prepared as pressed pellets and used to calibrate the spectrometer and to determine the accuracy and precision of the overall procedure. Corrections for matrix effects were made by a calibration method (O'Reilly and King, 1986) that calculates the relation of the incoherent and coherent scattered radiation with the atomic number of the elements constituents of the sediments. Samples and certified reference materials were irradiated under different excitation conditions allowing the determination of a set of elements, amongst which the Br and Pb contents.…”
Section: Sediment Surface Samplesmentioning
confidence: 99%
“…The sponge samples, as well as the standards, have a high content in light elements (H, C, N and O) which in spite of being non-detectable by the EDXRF technique have to be taken in consideration to correct California, 1990), corrects the light element absorption on the basis of the mean atomic number of the sample, which is determined from the ratio of the incoherently and coherently scattered intensity radiation by the sample (O'Reilly and King, 1986). For this purpose six pellets of pure compounds (C 6 H 10 O 5 , H 3 BO 3 , NH 4 NO 3 , (NH 4 ) 2 SO 4 , NaF and Na 2 SO 4 ) were used to establish the correlations between the intensities of the Compton and Rayleigh scattered X-rays of the Ag secondary target by the irradiated sample with the average atomic number (Z).…”
Section: Methodsmentioning
confidence: 99%