2003
DOI: 10.1016/s0257-8972(03)00078-1
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Formation of titanium silicide thin films on Si(100) substrate by RF plasma CVD

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Cited by 11 publications
(6 citation statements)
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“…Deposition at high substrate temperature around 800°C has yielded irregular and very small structures which may be due to re-evaporation of Cu atoms due to high kinetic energy acquired from the substrate. This is similar to findings reported for other metal silicides [1015]. During in-situ deposition at optimum high substrate temperatures, the deposited ad-atoms have sufficient energy to find equilibrium positions leading to well-defined features.…”
Section: Resultssupporting
confidence: 88%
See 1 more Smart Citation
“…Deposition at high substrate temperature around 800°C has yielded irregular and very small structures which may be due to re-evaporation of Cu atoms due to high kinetic energy acquired from the substrate. This is similar to findings reported for other metal silicides [1015]. During in-situ deposition at optimum high substrate temperatures, the deposited ad-atoms have sufficient energy to find equilibrium positions leading to well-defined features.…”
Section: Resultssupporting
confidence: 88%
“…Though a lot of work has been reported on metal silicides, the Cu/Si system has not been investigated as thoroughly as other systems such as Ag/Si, Au/Si, Ti/Si and Pt/Si etc [9][10][11][12][13][14][15]. Ordered 2-dimensional (2D) Cu nanostructures on Si(111) have been reported for very low thicknesses by Zang et al [16].…”
Section: Introductionmentioning
confidence: 99%
“…This is considered to be due to the formation of titanium silicide. 25,26) It is reported from a laser irradiation experiment that TiSi and TiSi 2 are formed below and above 500 C, respectively. 26) The depth profiles of Ti and O in the film are different from those at 300 C in Fig.…”
Section: Elemental Diffusion Model By Oxidationmentioning
confidence: 99%
“…28 Due to its low electrical resistivity (approximately 13-16 μΩ cm), high-temperature stability, and good corrosion resistance, TiSi 2 has been widely employed to manufacture microelectronic devices, such as gate electrode wiring, connector products, Schottky barriers, and ohmic contact materials. 29 Currently, the methods to prepare TiSi 2 include chemical vapor deposition, 30 self-propagating high-temperature synthesis, 31 and mechanical alloying. 32 These synthesis methods used high-purity Ti and Si as raw materials to synthesize TiSi 2 with a stoichiometric molar ratio of 1 : 2 (Ti : Si), but the use of high-purity Ti and Si makes these processes expensive.…”
Section: Introductionmentioning
confidence: 99%