2013
DOI: 10.1111/ijac.12049
|View full text |Cite
|
Sign up to set email alerts
|

Formation ofCuAlO2at theCu/Al2O3Interface and its Influence on Interface Strength and Thermal Conductivity

Abstract: The criteria for the formation of a CuAlO 2 reaction phase at the Cu/Al 2 O 3 interface are explored. Oxygen solutes up to 2 wt% were introduced into the copper first. The bonding was carried out at 1075°C. The reaction phase was observed only when the oxygen solute in copper before bonding was higher than 1.3 wt%. The CuAlO 2 phase is polycrystalline and covers only part of the interface. The CuAlO 2 grains interact with the crack, which improves the interface strength. As CuAlO 2 is not continuous at the int… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
4
1

Citation Types

0
9
0

Year Published

2014
2014
2024
2024

Publication Types

Select...
7

Relationship

2
5

Authors

Journals

citations
Cited by 11 publications
(9 citation statements)
references
References 31 publications
0
9
0
Order By: Relevance
“…17,18 The substrates fabricated with the technique exhibit both high interface strength and high thermal conductivity. 7 The substrates are currently used as the heat-dissipation substrates for power transistors. 8 For such application, chemical etching routine is employed first on the top copper layer to produce electric circuit; the transistor is then mounted.…”
Section: Discussionmentioning
confidence: 99%
See 2 more Smart Citations
“…17,18 The substrates fabricated with the technique exhibit both high interface strength and high thermal conductivity. 7 The substrates are currently used as the heat-dissipation substrates for power transistors. 8 For such application, chemical etching routine is employed first on the top copper layer to produce electric circuit; the transistor is then mounted.…”
Section: Discussionmentioning
confidence: 99%
“…More importantly, the laminates prepared with the technique exhibit both high interface strength and high thermal conductivity. 6,7 However, many large pores (voids), with the size from 10 to 500 lm, are present at the interface after bonding. [8][9][10][11][12][13][14][15] The presence of such large pores at interface is detrimental to the long-term reliability of laminate.…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…A reaction phase, CuAlO 2 , may be formed, as the dissolved oxygen is higher than a critical value. Many previous studies suggested that interface strength increased with the formation of CuAlO 2 . The CuAlO 2 crystal exhibits anisotropic thermal expansion characteristics.…”
Section: Introductionmentioning
confidence: 95%
“…Despite huge elastic and thermal expansion mismatches between copper and alumina, many studies have demonstrated that alumina can be bonded to copper using a eutectic bonding technique . The process takes the advantage of eutectic liquid formation in the Cu‐O system.…”
Section: Introductionmentioning
confidence: 99%