1997
DOI: 10.1016/s0304-3886(97)00133-2
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Formation of electrified images using electron and ion beams

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Cited by 9 publications
(14 citation statements)
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“…The modified surface was changed from hydrophilic to hydrophobic. Electrified patterns were formed on the modified substrates with a 30keV focused ion beam (Ga + -FIB; SMI-8000D, Seiko Instrument Co., Tokyo) equipped with a CAD system [13]. Figure 1 shows schematic procedures for particle deposition on an electrified pattern of the substrate.…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…The modified surface was changed from hydrophilic to hydrophobic. Electrified patterns were formed on the modified substrates with a 30keV focused ion beam (Ga + -FIB; SMI-8000D, Seiko Instrument Co., Tokyo) equipped with a CAD system [13]. Figure 1 shows schematic procedures for particle deposition on an electrified pattern of the substrate.…”
Section: Methodsmentioning
confidence: 99%
“…This technique is principally based on electrophotography [12]. The main procedure is composed of the following two steps: An electrified pattern is formed on a non-conductive substrate by scanning an electron beam [13]. The substrate with the electrified pattern is then dipped into the suspensions in which the micro-sized particles were dispersed.…”
Section: Introductionmentioning
confidence: 99%
“…Therefore, we have developed a technique for the formation of an electrified pattern on non-conductive ceramicslls). [lgl,l 20 1. Next, the adhesion process deposits particles on the electrified pattern.…”
Section: Overview Of Manipulating Techniques For Particlesmentioning
confidence: 99%
“…Ga + -FIB drawing can form a fine charge pattern compared with electron beam drawing. [14] Second, the substrate is immersed in a suspension in which particles are dispersed. In this suspension, the particles are attracted to the charged dots and are selectively deposited on them individually.…”
mentioning
confidence: 99%
“…In our previous study, a positively charged pattern shows a dark contrast in the SEM image due to a reduction of secondary electrons from the positively charged pattern. [14] This is called a voltage contrast image using an SEM observation. The dark area shown in Figure 2 corresponds to the positively charged dots on the substrate.…”
mentioning
confidence: 99%