2013
DOI: 10.1021/jz401585d
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Formation of Al Nanostructures on Alq3: An in Situ Grazing Incidence Small Angle X-ray Scattering Study during Radio Frequency Sputter Deposition

Abstract: The formation of metal/organic interfaces is a complicated process involving chemical interaction, physical nucleation and diffusion, and thin film growth. It is closely related to the performance of organic electronic devices. To understand this process, we investigate the system of aluminum (Al) and tris(8-hydroxyquinolinato)-aluminum (Alq3) as a model, owing to the well-known strong chemical interaction between both and their close technological relevance to organic light emitting devices. By using grazing … Show more

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Cited by 39 publications
(51 citation statements)
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References 37 publications
(60 reference statements)
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“…20,21 Recently, it has also been proven to be a very powerful tool for in-situ characterizing the growth of thin nanostructured metallic films, with time resolution in the order of tenths of milliseconds. [22][23][24] Due to the shallow incidence angle used, GISAXS provides statistically relevant information over a large sample area.…”
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confidence: 99%
“…20,21 Recently, it has also been proven to be a very powerful tool for in-situ characterizing the growth of thin nanostructured metallic films, with time resolution in the order of tenths of milliseconds. [22][23][24] Due to the shallow incidence angle used, GISAXS provides statistically relevant information over a large sample area.…”
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confidence: 99%
“…20 A thorough understanding of their growth and structure is prerequisite to the efficient implementation on a technological basis, since the morphology of OSCs has a strong impact on their charge carrier mobility and other physical properties. 1,[20][21][22][23][24][25][26][27][28][29][30] The basic understanding has largely remained on a qualitative level, since in most cases the film structure is not sufficiently well defined due to complex structural phenomena such as phase coexistence, changes in the molecular conformation or orientation, and morphological transitions. Thus there is the avid need to comprehend the different structural aspects of the hybrid structures like, e.g.…”
mentioning
confidence: 99%
“…However, this method is not applicable for polycrystalline coatings. In situ small-angle X-ray scattering methods such as, for example, GISAXS or in situ X-ray reflectivity (XRR) measurements are independent of the crystalline structure and can be applied to almost any coating (Renaud et al, 2009;Yu et al, 2013). For ex situ samples, XRR is a well established method used by a large community (Tolan, 1999).…”
Section: Introductionmentioning
confidence: 99%