1998
DOI: 10.1007/s003390051155
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Force microscopy for the investigation of high-frequency surface acoustic wave devices

Abstract: Surface acoustic wave (SAW) devices are of great importance in mobile communication and signal processing applications. For their optimization second-order effects, like diffraction or mass loading, have to be studied. However, meeting today's demands of GHz operation new ways of wave field mapping have to be developed, since common methods, like laser optical or electron microscope probing, are resolution limited to the micron range. Scanning acoustic force microscopy (SAFM) allows the detection of the high-f… Show more

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Cited by 2 publications
(2 citation statements)
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“…38,39 Most of these devices are technologically relevant for filtering purposes. The knowledge and systematic study of the wave excitation and propagation (like reflection or scattering) within IDTs are important for a better understanding of acoustic devices and give a possible path for their improvement.…”
Section: Acoustic Device Analysismentioning
confidence: 99%
“…38,39 Most of these devices are technologically relevant for filtering purposes. The knowledge and systematic study of the wave excitation and propagation (like reflection or scattering) within IDTs are important for a better understanding of acoustic devices and give a possible path for their improvement.…”
Section: Acoustic Device Analysismentioning
confidence: 99%
“…The ability to detect in-plane polarized SAW modes [156] allows for the analysis of resonator devices which make use of transversally polarized acoustic modes. This type of device is of broad interest since the achievable frequencies are about 40% higher than in Rayleigh wave-based devices.…”
Section: Resonator Structuresmentioning
confidence: 99%