2016
DOI: 10.1364/ao.55.007434
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Focal length measurement based on Fresnel diffraction from a phase plate

Abstract: A method based on the Fresnel diffraction of light from the phase step is introduced for measuring effective focal length (EFL) and back focal length (BFL) of optical imaging systems. It is shown that, as a transparent plane-parallel plate is illuminated at a boundary region by a monochromatic beam of light, Fresnel diffraction occurs because of the abrupt change in phase imposed by the finite change in refractive index at the plate boundary. Variation of the incident angle in a convergent (or divergent) beam … Show more

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Cited by 20 publications
(5 citation statements)
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“…Finally, we should mention that the researchers have applied the Fresnel diffraction from a phase step to the measurements of the refractive index in X-ray region [23], film thickness [24][25][26], etching rate [27], simultaneous measurement of film thickness and refractive index [26], focal lengths of the lenses [28], specification of the spectral line profile [29], and modulation of phase function [30], Applications are increasing, particularly, in quantitative imaging of the phase objects in different scales [13,[31][32].…”
Section: Measurement Of Diffusion Coefficientmentioning
confidence: 99%
“…Finally, we should mention that the researchers have applied the Fresnel diffraction from a phase step to the measurements of the refractive index in X-ray region [23], film thickness [24][25][26], etching rate [27], simultaneous measurement of film thickness and refractive index [26], focal lengths of the lenses [28], specification of the spectral line profile [29], and modulation of phase function [30], Applications are increasing, particularly, in quantitative imaging of the phase objects in different scales [13,[31][32].…”
Section: Measurement Of Diffusion Coefficientmentioning
confidence: 99%
“…In the case of negative lenses, an auxiliary positive lens is used to achieve the convergence of the rays and take an "indirect" measurement of the focal length by means of the experimental determination of the "back focal length." This process can be performed using different techniques or physical approaches, such as Fresnel diffraction, which, unlike the method proposed in this study, considers an angle of incidence [31]. Thus, the method proposed here produces better measurable results.…”
Section: Introductionmentioning
confidence: 99%
“…Thus far, Fresnel diffraction from a phase step is studied [27][28][29] and widely considered in the context of different metrological applications, e.g., the measurement of refractive indices of solids and liquids [30][31][32], thickness of films and plates [33], focal length of an imaging system [34], etching rate of glass steps [35], and determination of the off-axis angle and the wavelength of light [36].…”
Section: Introductionmentioning
confidence: 99%