2019
DOI: 10.1063/1.5123353
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Quantitative phase imaging based on Fresnel diffraction from a phase plate

Abstract: The structural complexity and instability of many interference phase microscopy methods are the major obstacles toward high-precision phase measurement. In this vein, improving more efficient configurations as well as proposing new methods are the subjects of growing interest. Here we introduce Fresnel diffraction from a phase step to the realm of quantitative phase imaging. By employing Fresnel diffraction of a divergent (or convergent) beam of light from a plane-parallel phase plate, we provide a viable, sim… Show more

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Cited by 24 publications
(5 citation statements)
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“…The first systematic and in-depth study of diffraction from a phase step was published by M. T. Tavassoly et al in the early 2000s 34 , and it has since expanded into a variety of technological fields over the past two decades 35 . Because of this, it has led to the development of numerous new optical metrology features and applications, such as the measurement of film thickness 36 , high-precision refractometry 37 , 38 , nanometer displacement measurement 39 , refractive index gradient in inhomogeneous phase objects and diffusion processes 35 , 40 , spectral modifications 41 43 , wavemetry 44 , real-time monitoring and measurement of chemical etching rate of transparent materials 45 , and 3D imaging 46 , 47 , alongside a lot of many other uses inspired by phase objects’ FD capabilities.…”
Section: Theory and Procedures Of The Diffractometry Methodsmentioning
confidence: 99%
“…The first systematic and in-depth study of diffraction from a phase step was published by M. T. Tavassoly et al in the early 2000s 34 , and it has since expanded into a variety of technological fields over the past two decades 35 . Because of this, it has led to the development of numerous new optical metrology features and applications, such as the measurement of film thickness 36 , high-precision refractometry 37 , 38 , nanometer displacement measurement 39 , refractive index gradient in inhomogeneous phase objects and diffusion processes 35 , 40 , spectral modifications 41 43 , wavemetry 44 , real-time monitoring and measurement of chemical etching rate of transparent materials 45 , and 3D imaging 46 , 47 , alongside a lot of many other uses inspired by phase objects’ FD capabilities.…”
Section: Theory and Procedures Of The Diffractometry Methodsmentioning
confidence: 99%
“…Finally, we should mention that the researchers have applied the Fresnel diffraction from a phase step to the measurements of the refractive index in X-ray region [23], film thickness [24][25][26], etching rate [27], simultaneous measurement of film thickness and refractive index [26], focal lengths of the lenses [28], specification of the spectral line profile [29], and modulation of phase function [30], Applications are increasing, particularly, in quantitative imaging of the phase objects in different scales [13,[31][32].…”
Section: Measurement Of Diffusion Coefficientmentioning
confidence: 99%
“…Different from separated-path iQPMs, common-path iQPMs modulate the object beam and the reference beam into the same or almost the same path, so they are more stable, compact and robust against the noise. Various common-path iQPMs have been reported using two-aperture interferometric geometry [10][11][12][13][14][15][16]. For example, a double-aperture common-path interferometer [16] can introduce a carrier frequency by shifting the first lens or grating in a 4f optical imaging system without tilting the mirror or beam.…”
Section: Introductionmentioning
confidence: 99%