No abstract

Interference of light has numerous metrological applications because the optical path difference (OPD) can be varied at will between the interfering waves in the interferometers. We show how one can desirably change the optical path difference in diffraction. This leads to many novel and interesting metrological applications including high-precision measurements of displacement, phase change, refractive index profile, temperature gradient, diffusion coefficient, and coherence parameters, to name only a few. The subject fundamentally differs from interferometry in the sense that in the latter the measurement criterion is the change in intensity or fringe location, while in the former the criterion is the change in the visibility of fringes with an already known intensity profile. The visibility can vary from zero to one as the OPD changes by a half-wave. Therefore, measurements with the accuracy of a few nanometers are quite feasible. Also, the possibility of changing the OPD in diffraction allows us to use Fresnel diffraction in Fourier spectrometry, to enhance or suppress diffracted fields, and to build phase singularities that have many novel and useful applications.

When a thin film that is prepared in a step form on a substrate and coated uniformly with a reflective material is illuminated by a parallel coherent beam of monochromatic light, the Fresnel diffraction fringes are formed on a screen perpendicular to the reflected beam. The visibility of the fringes depends on film thickness, angle of incidence, and light wavelength. Measuring visibility versus incident angle provides the film thickness with an accuracy of a few nanometers. The technique is easily applicable and it covers a wide range of thicknesses with highly reliable results.

A method that utilizes the Fresnel diffraction of light from the phase step formed by a transparent wedge is introduced for measuring the refractive indices of transparent solids, liquids, and solutions. It is shown that, as a transparent wedge of small apex angle is illuminated perpendicular to its surface by a monochromatic parallel beam of light, the Fresnel fringes, caused by abrupt change in refractive index at the wedge lateral boundary, are formed on a screen held perpendicular to the beam propagation direction. The visibility of the fringes varies periodically between zero and 1 in the direction normal to the wedge apex. For a known or measured apex angle, the wedge refractive index is obtained by measuring the period length by a CCD. To measure the refractive index of a transparent liquid or solution, the wedge is installed in a transparent rectangle cell containing the sample. Then, the cell is illuminated perpendicularly and the visibility period is measured. By using modest optics, one can measure the refractive index at a relative uncertainty level of 10(-5). There is no limitation on the refractive index range. The method can be applied easily with no mechanical manipulation. The measuring apparatus can be very compact with low mechanical and optical noises.

We introduce a relatively simple and efficient optical technique to measure nanoscale displacement based on visibility variations of the Fresnel diffraction fringes from a two-dimensional phase step. In this paper we use our technique to measure electromechanical expansions by a thin piezoelectric ceramic and also thermal changes in the diameter of a tungsten wire. Early results provide convincing evidence that sensitivity up to a few nanometers can be achieved, and our technique has the potential to be used as a nanodisplacement probe.

When a slightly divergent laser beam passes through a turbulent ground level atmosphere and strikes a linear grating, fluctuating self-images are formed at Talbot distances. By superimposing a similar grating on one of the self-images, even for the case of parallel gratings' lines, fluctuating moiré fringes are formed owing to the beam divergence. Recording the successive moiré patterns by a CCD camera and feeding them to a computer, after filtering the higher spatial frequencies, produces highly magnified fluctuations of the laser beam. Using moiré fringe fluctuations we have calculated the fluctuations of the angle of arrival and the atmospheric refractive index structure constant. The implementation of the technique is straightforward, a telescope is not required, fluctuations can be magnified more than ten times, and the precision of the technique is similar to that reported in our previous work.

When a transparent plane-parallel plate is illuminated at the edge region by a quasi-monochromatic parallel beam of light, diffraction fringes appear on a plane perpendicular to the transmitted beam direction. The sharp change in the refractive index at the plate boundary imposes an abrupt change on the phase of the illuminating beam that leads to the Fresnel diffraction. The visibility of the diffraction fringes depends on the plate thickness, refractive index, light wavelength, and angle of incidence. In this report we show that, by recording the visibility repetition versus incident angle, one can measure the plate refractive index, its thickness, and light wavelength very accurately. It is also shown that the technique is indispensable for specifying color dispersion in plate shape samples. The technique is applied to the measurement of dispersion in a fused silica plate and the refractive indices of soda lime slides.

When a transparent plane-parallel plate is illuminated at a boundary region by a monochromatic parallel beam of light, Fresnel diffraction occurs because of the abrupt change in phase imposed by the finite change in refractive index at the plate boundary. The visibility of the diffraction fringes varies periodically with changes in incident angle. The visibility period depends on the plate thickness and the refractive indices of the plate and the surrounding medium. Plotting the phase change versus incident angle or counting the visibility repetition in an incident-angle interval provides, for a given plate thickness, the refractive index of the plate very accurately. It is shown here that the refractive index of a plate can be determined without knowing the plate thickness. Therefore, the technique can be utilized for measuring plate thickness with high precision. In addition, by installing a plate with known refractive index in a rectangular cell filled with a liquid and following the described procedures, the refractive index of the liquid is obtained. The technique is applied to measure the refractive indices of a glass slide, distilled water, and ethanol. The potential and merits of the technique are also discussed.