2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/R 2016
DOI: 10.1109/nssmic.2016.8069857
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First measurements of a prototype of a new generation pixel readout ASIC in 65 nm CMOS for extreme rate HEP detectors at HL-LHC

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Cited by 4 publications
(2 citation statements)
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“…Off-line data analyses are then performed using a set of Python/ROOT macros. Extensive pre-irradiation electrical tests validated expected chip functionalities [6]. All global DACs and the monitoring ADC placed at the chip periphery exhibit excellent linearity in agreement with simulations, providing reliable bias conditions and charge-injection characteristic for analog front-ends characterizations.…”
Section: Summary Of Pre-irradiation and Post-irradiation Resultssupporting
confidence: 58%
“…Off-line data analyses are then performed using a set of Python/ROOT macros. Extensive pre-irradiation electrical tests validated expected chip functionalities [6]. All global DACs and the monitoring ADC placed at the chip periphery exhibit excellent linearity in agreement with simulations, providing reliable bias conditions and charge-injection characteristic for analog front-ends characterizations.…”
Section: Summary Of Pre-irradiation and Post-irradiation Resultssupporting
confidence: 58%
“…A Phase-Locked Loop (PLL) device generates the high-speed clock required in the highspeed (dark blue) uplinks. Radiation tolerant Serializer (SER) and Deserializer (DES) allow the communication with more FE modules, as four RD53A front-ends [10], achieving a whole data rate up to 10 Gbps. While the electrical driver and receiver work as interfaces for the optical side (photodiode and MZM).…”
Section: Detector Modulementioning
confidence: 99%