2009
DOI: 10.1017/s1431927609095609
|View full text |Cite
|
Sign up to set email alerts
|

Field Evaporation of Octadecanethiol

Abstract: Our group has reported atom probe tomography (APT) results for poly(3-alkylthiophene)s deposited on metal carrier tips previously [1,2]. The tip topology and mass fragment distributions were found to be dependent on both incident laser energy density and the deposition method. Mass peaks clearly identifiable as sulfur-containing were difficult to assign, but the alkane signature peaks were abundant and very easy to identify. Because sulfur has two isotopes of reasonable abundance (95% S 32 , 4.2% S 34 ) the po… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1

Citation Types

0
5
0

Year Published

2010
2010
2019
2019

Publication Types

Select...
5
1

Relationship

1
5

Authors

Journals

citations
Cited by 6 publications
(5 citation statements)
references
References 3 publications
(4 reference statements)
0
5
0
Order By: Relevance
“…PLAP) in atom probe, first initiated by Kellogg and Tsong [10] in 1980, has been recently further studied both theoretically and practically [11][12][13] and the application of atom probe has been greatly widened [14][15][16]. Indeed, high voltage (HV) pulsed APT is mainly used to analyze samples with conductivities larger than $ 10 À 2 O À 1 cm À 1 [14], and is not suitable to analyze less conductive non-metallic materials due to the improper transmission of pulsed voltage down to the tip apex.…”
Section: Introductionmentioning
confidence: 99%
“…PLAP) in atom probe, first initiated by Kellogg and Tsong [10] in 1980, has been recently further studied both theoretically and practically [11][12][13] and the application of atom probe has been greatly widened [14][15][16]. Indeed, high voltage (HV) pulsed APT is mainly used to analyze samples with conductivities larger than $ 10 À 2 O À 1 cm À 1 [14], and is not suitable to analyze less conductive non-metallic materials due to the improper transmission of pulsed voltage down to the tip apex.…”
Section: Introductionmentioning
confidence: 99%
“…Final extraction and placement of the ROI within a sharp specimen tip was performed using routine FIB procedures [20–21]. In this case, the specimen was inverted prior to mounting and sharpening to prevent a layer with poor adhesion from being present in the final specimen tip [22]. The extracted and inverted material was placed on posts on a microtip coupon (Figure 1c), the result of which is shown in Figure 2d.…”
Section: Specimen Preparationmentioning
confidence: 99%
“…Laser pulsing heats the specimen tip surface, lowering the required electric field for field evaporation and, consequently, reducing premature specimen failure from stresses generated by the electric field. We discuss here the rapidly improving analysis capabilities for self-assembled monolayers [11][12][13], polymers [14][15][16], and the complex architecture of a tooth biomineral nanocomposite [17].…”
Section: Early Workmentioning
confidence: 99%