1988
DOI: 10.1007/978-1-4613-1687-9
|View full text |Cite
|
Sign up to set email alerts
|

FET Modeling for Circuit Simulation

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

0
7
0

Year Published

1992
1992
2006
2006

Publication Types

Select...
3
3
3

Relationship

0
9

Authors

Journals

citations
Cited by 30 publications
(7 citation statements)
references
References 0 publications
0
7
0
Order By: Relevance
“…Current mirrors are assumed to be ideal. Expressions used to model these effects are found in [4]. Hand analysis showed that the mobility degradation of M I and Mz and the channel length modulation of M3 and n/r, contribute to the distortion the most; these observations were confirmed by computer simulations.…”
Section: Second Order Effectsmentioning
confidence: 52%
“…Current mirrors are assumed to be ideal. Expressions used to model these effects are found in [4]. Hand analysis showed that the mobility degradation of M I and Mz and the channel length modulation of M3 and n/r, contribute to the distortion the most; these observations were confirmed by computer simulations.…”
Section: Second Order Effectsmentioning
confidence: 52%
“…3 was obtained under the following assumptions: an ideal current source I b is biasing the VCO; the diodes function as capacitors; the substrate capacity is neglegible; the circuit is perfectly symmetric; and the control voltage is constant. We use the Schichman-Hodges PMOS model [5], where the current I DS (V GS , V DS ) is given piecewise as follows: …”
Section: Verification Of Oscillator Circuitsmentioning
confidence: 99%
“…At ÿrst, the linear AC situation is studied, and then the result is compared with the small-signal limit given by the large-signal analysis. Using Equations (15) and (16) and writing the equations for the power delivered to the source and drain ports of the circuit…”
Section: Small-signal and Large-signal Powers In Charge Elementsmentioning
confidence: 99%