Ferroelectrics - Physical Effects 2011
DOI: 10.5772/17147
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Ferroelectric Properties and Polarization Switching Kinetic of Poly (vinylidene fluoride-trifluoroethylene) Copolymer

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Cited by 39 publications
(48 citation statements)
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References 41 publications
(57 reference statements)
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“…In the β crystalline phase of P(VDF-TrFE), the unit cell is orthorhombic, with each chain aligned and packed with the CF 2 groups parallel to the b-axis [11,15]. Figure 1a shows the XRD pattern of P(VDF-TrFE) for different annealing temperatures (80, 90, 100, 110, 120, 140 °C) to obtain information on the degree of the crystalline structure of the copolymer thin films.…”
Section: Resultsmentioning
confidence: 99%
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“…In the β crystalline phase of P(VDF-TrFE), the unit cell is orthorhombic, with each chain aligned and packed with the CF 2 groups parallel to the b-axis [11,15]. Figure 1a shows the XRD pattern of P(VDF-TrFE) for different annealing temperatures (80, 90, 100, 110, 120, 140 °C) to obtain information on the degree of the crystalline structure of the copolymer thin films.…”
Section: Resultsmentioning
confidence: 99%
“…Annealing can be used to improve the crystalline structure, reduce the porosity and ensure the elimination of the residual solvent used during the fabrication process of P(VDF-TrFE) thin films. The temperature used for annealing, the time of annealing and the rate of ramping up and cooling are three important parameters in the thermal annealing process [11]. Annealing temperature must be above the Curie temperature, T c , and below the melting point, T m , of the material when the material is in between the ferroelectric phase and the paraelectric phase.…”
Section: Introductionmentioning
confidence: 99%
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“…The electrical performance of our 2T2C FRAM array can be further improved by enhancing the TFT channel mobility, Vt stability, quality of the ferroelectric film, and process integration. We have demonstrated <50-μs switching time and >1×10 6 stress cycle fatigue capability for the isolated ferroelectric capacitor [26], [27], [30]. Further study on the frequency response of the 2T2C FRAM array and reliability including memory window degradation during program/read stress, and data retention are important and needed for future development.…”
Section: Resultsmentioning
confidence: 88%
“…The data writing time t DW is programmed to be 200 ms (t DWH = t DWl = 1/2 t DW ), t WR is 300 ms, and all other ac time parameters are set to be 100 ms. The program and read times depend on applied voltage as discussed earlier in [26] and [30] and can be optimized for different applications. In Fig.…”
Section: Resultsmentioning
confidence: 99%