2021
DOI: 10.1088/1361-6641/ac1b11
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Ferroelectric HfO2-based synaptic devices: recent trends and prospects

Abstract: Neuro-inspired deep learning algorithms have shown promising futures in artificial intelligence. Despite the remarkable progress in software-based neural networks, the traditional von-Neumann hardware architecture has suffered from limited energy efficiency while facing unprecedented large amounts of data. To meet the performance requirements of neuro-inspired computing, large-scale vector-matrix multiplication is preferred to be performed in situ, namely compute-in-memory. Non-volatile memory devices with dif… Show more

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Cited by 34 publications
(30 citation statements)
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“…The discovery 1 of ferroelectricity in a metastable orthorhombic phase (Pca2 1 space group) of Si-doped HfO 2 has generated huge interest. [2][3][4][5][6][7] The ferroelectric phase has also been stabilized in HfO 2 doped with other atoms. 7,8 The ferroelectric properties of HfO 2 have been investigated mainly in polycrystalline films, although there is increasing interest in epitaxial films after the demonstration of epitaxial stabilization on yttria-stabilized zirconia 9 and perovskite [10][11][12] single crystalline substrates.…”
Section: Introductionmentioning
confidence: 99%
“…The discovery 1 of ferroelectricity in a metastable orthorhombic phase (Pca2 1 space group) of Si-doped HfO 2 has generated huge interest. [2][3][4][5][6][7] The ferroelectric phase has also been stabilized in HfO 2 doped with other atoms. 7,8 The ferroelectric properties of HfO 2 have been investigated mainly in polycrystalline films, although there is increasing interest in epitaxial films after the demonstration of epitaxial stabilization on yttria-stabilized zirconia 9 and perovskite [10][11][12] single crystalline substrates.…”
Section: Introductionmentioning
confidence: 99%
“…However, it suffers from issues such as destructive read and low distinguishability between the memory states. Ferroelectric FETs (FEFETs), in which the ferroelectric material is integrated within the gate stack of a transistor (Yu et al, 2021), offer appealing attributes that mitigate the concerns of FERAMs. For instance, FEFETs feature separation of read-write paths, non-destructive read, and high distinguishability while retaining the benefits of electric field-driven write (Yu et al, 2021) and offering other advantages such as multilevel storage (Ni et al, 2018;Dutta et al, 2020;Kazemi et al, 2020;Liao et al, 2021).…”
Section: Background Of Ferroelectric-based Memoriesmentioning
confidence: 99%
“…Ferroelectric FETs (FEFETs), in which the ferroelectric material is integrated within the gate stack of a transistor (Yu et al, 2021), offer appealing attributes that mitigate the concerns of FERAMs. For instance, FEFETs feature separation of read-write paths, non-destructive read, and high distinguishability while retaining the benefits of electric field-driven write (Yu et al, 2021) and offering other advantages such as multilevel storage (Ni et al, 2018;Dutta et al, 2020;Kazemi et al, 2020;Liao et al, 2021). However, they are known to suffer from variability, endurance, and retention concerns due to traps at the ferroelectric-dielectric interface and depolarization fields in the ferroelectric.…”
Section: Background Of Ferroelectric-based Memoriesmentioning
confidence: 99%
“…HfO 2 based stacks have been proposed and optimized toward nonvolatile RRAM since more than 15 years [4,6,13,19]. In addition, HfO 2 possesses a set of key properties, including (i) high dielectric constant for scalable CMOS technology, both for logic and charge trap memory devices [20,21], (ii) controllable ferroelectricity/antiferroelectricity behavior for high density memory and for synaptic devices [22,23], and (iii) high compatibility with the CMOS process. HfO 2 thus appears as a dielectric material of choice for microelectronic systems encompassing logic, memory and neuromorphic functions on the same chip.…”
Section: Introductionmentioning
confidence: 99%