Femtosecond Laser Simulation Facility for SEE IC Testing

Егоров, А. С.; Chumakov, A. I.; Mavritskiy, Oleg B.; Pechenkin, Alexander; Savchenkov, D. V.; Telets, V. A.; Yanenko, Andrey V.

doi:10.1109/redw.2014.7004570

Cited by 14 publications

(5 citation statements)

References 6 publications

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“…Developed hardware and software complex has been successfully approbated for testing microcontrollers with built in ADC during experiments at MEPhI facilities [10,11]. Our test setup is based on the analog and digital inputoutput board PXI-7841R by National Instruments.…”

Section: Discussionmentioning

confidence: 99%

Automated test setup for functional and parametrical control of microcontrollers with internal ADC

Loskutov

Karakozov

Nekrasov

2016

2016 International Siberian Conference on Control and Communications (SIBCON)

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the developed automated test setup for microcontrollers with internal analog-to-digital converters is presented. The solution uses PXI-4110 and PXI-7841R modular instruments and LabVIEW software along with individually designed boards. The article also discusses testing methods of the internal digital and analog blocks of microcontrollers, algorithm of ADC's parameters measurement and electromagnetic interference protection during testing.

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Section: Discussionmentioning

confidence: 99%

Automated test setup for functional and parametrical control of microcontrollers with internal ADC

Loskutov

Karakozov

Nekrasov

2016

2016 International Siberian Conference on Control and Communications (SIBCON)

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“…Authors continue their work in the developing of SEE laser testing systems using various laser sources, optics and mechanics with enhanced capabilities, including better beam quality, femtosecond pulse range with variable pulse duration, more precise object positioning and higher resolution of the microscope. The new FEMTO-T model of femtosecond laser system for SEE IC testing is presented and described in 17,18 .…”

Section: Pico-3 and Pico-4 Laser Testing Systems Applicationmentioning

confidence: 99%

Ultrashort pulsed laser tools for testing of semiconductor elements hardness to single event effects, caused by cosmic heavy charged particles

et al. 2015

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The installations for laser testing of microelectronic elements (first of all -integrated circuits) of devices for space applications for hardness to local radiation effects from heavy charged particles are presented. The possibility of a focused pulsed laser radiation application to the study of local radiation effects, caused by single heavy charged particles, is explained. The fundamentals of an approach to the construction of test sets, based on the picosecond and femtosecond lasers and systems for focusing their radiation, are considered. The main technical requirements for the basic modules of sets for laser testing (laser wavelength and pulse duration and repetition rate, spatial beam parameters and minimal spot size, speed of object movement and so on) are substantiated. All worked out sets have a full-featured software for the operational management of all modules of the laser test facility, including the positioning of the object, to provide feedback from the measurement results of the reaction of the object on the laser excitation. The parameters of developed laser hardware and software systems and their foreign counterparts are compared. Further improvement directions for laser testing tools are briefly outlined. The discussion is also presented of described hardware technical and operational characteristics, allowing to use it for a variety of scientific research studies, requiring selective (with submicron spatial resolution) object excitation by ultrashort laser pulses and recording responses to this effect with the exact timing of the moment of excitation, as well as to perform a variety of high precision technological operations.

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“…Due to the ability of changing focus length, a 3-D SEEs profile can be also achieved by laser systems [11,12]. Meanwhile, for the abilities of fast scanning speed and repeatability, the laser system can be further used to find sensitive area in the whole area of IC circuit or analogue circuit [13,14]. As a complementary SEEs testing tool for particle accelerators, the injected laser energy could be correlated with the Linear Energy Transfer (LET) value in particle accelerator testing, which helps us to build a solid relationship between these two testing methods [15,16].…”

Section: Introductionmentioning

confidence: 99%

Application of Two-Photon-Absorption Pulsed Laser for Single-Event-Effects Sensitivity Mapping Technology

Chen

Belev

et al. 2019

Materials

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Single-event effects (SEEs) in integrated circuits and devices can be studied by utilizing ultra-fast pulsed laser system through Two Photon Absorption process. This paper presents technical ways to characterize key factors for laser based SEEs mapping testing system: output power from laser source, spot size focused by objective lens, opening window of Pockels cell, and calibration of injected laser energy. The laser based SEEs mapping testing system can work in a stable and controllable status by applying these methods. Furthermore, a sensitivity map of a Static Random Access Memory (SRAM) cell with a 65 nm technique node was created through the established laser system. The sensitivity map of the SRAM cell was compared to a map generated by a commercial simulation tool (TFIT), and the two matched well. In addition, experiments in this paper also provided energy distribution profile along Z axis that is the direction of the pulsed laser injection and threshold energy for different SRAM structures.

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Femtosecond Laser Simulation Facility for SEE IC Testing

Cited by 14 publications

References 6 publications

Automated test setup for functional and parametrical control of microcontrollers with internal ADC

Automated test setup for functional and parametrical control of microcontrollers with internal ADC

Ultrashort pulsed laser tools for testing of semiconductor elements hardness to single event effects, caused by cosmic heavy charged particles

Application of Two-Photon-Absorption Pulsed Laser for Single-Event-Effects Sensitivity Mapping Technology

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