Automated test setup for functional and parametrical control of microcontrollers with internal ADC

Abstract

the developed automated test setup for microcontrollers with internal analog-to-digital converters is presented. The solution uses PXI-4110 and PXI-7841R modular instruments and LabVIEW software along with individually designed boards. The article also discusses testing methods of the internal digital and analog blocks of microcontrollers, algorithm of ADC's parameters measurement and electromagnetic interference protection during testing.