FEAT - A Simulation Tool for Electrothermal Analysis of Multifinger Bipolar Transistors

Abstract

In this paper, we present a new simulation tool, which can be effectively adopted for the electrothermal analysis of multifinger bipolar transistors. The program is based on an optimized procedure for solving the nonlinear system of equations governing the electrothermal device behavior. Features like model accuracy, short computation time, flexibility, and user friendliness make the proposed software a good candidate for optimizing both reliability and performance of modern transistors with complex layouts.

Characterization of PVD aluminum nitride for heat spreading in RF IC's

“…The values of thermal resistances are extracted by determining the point of onset of thermal instability, i.e., the starting point of negative differential resistance (also referred as flyback or snapback) [15], and results are given in Table I. The measurements have been compared with simulations based on analytical solutions of a system of non-linear algebraic equations that describe the BJT [16]. This model accounts for all the relevant phenomena needed for an electrothermal analysis [15], [17].…”