2018
DOI: 10.1016/j.aeue.2018.07.023
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Fault tolerant adaptive write schemes for improving endurance and reliability of memristor memories

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Cited by 13 publications
(9 citation statements)
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“…Application of a fixed write pulse can lead to degradation due to changes in the thickness/length of the break in the filament . To avoid this, the theoretical model [99] proposes a recording scheme that identifies the optimal amplitude and duration for the recording pulse. It has been found that the proposed scheme for various malfunctions of the memristor can effectively improve its endurance.…”
Section: Influence Of Switching the Pulse Parametersmentioning
confidence: 99%
“…Application of a fixed write pulse can lead to degradation due to changes in the thickness/length of the break in the filament . To avoid this, the theoretical model [99] proposes a recording scheme that identifies the optimal amplitude and duration for the recording pulse. It has been found that the proposed scheme for various malfunctions of the memristor can effectively improve its endurance.…”
Section: Influence Of Switching the Pulse Parametersmentioning
confidence: 99%
“…This is sometimes known as durability. [ 65,66 ] The figure on the left side of Figure a shows that once the proportion of switches arrives at a particular level, the memristors are degraded and their memory properties are lost. From the comparison of the picture located on the left and right sides of Figure 4a, it can be observed that the durability of the memristor can be affected by the setting of the switching voltage.…”
Section: Characteristics and Structural Classification Of Memristorsmentioning
confidence: 99%
“…Reliability and randomness of memristors: a) Endurance behavior in memristive devices; Reproduced with permission. [ 66 ] Copyright 2018, Elsevier. b) Current fluctuations in resistive random access memory because of RTN p .…”
Section: Characteristics and Structural Classification Of Memristorsmentioning
confidence: 99%
“…There are various types of memristor defects that may affect network performance, and usually they occur due to process variation [45], [46]. Examples of device defects are ageing faults, endurance degradation faults, switching delay faults, and stuck-at faults [47], [48]. Here, we will emphasize the stuck-at fault as it is ubiquitous and has high impact on 16.…”
Section: Device Failure and Network Robustnessmentioning
confidence: 99%